Relationship between ageing and deformation characteristics, and microdefects in aluminium-lithium alloys: an X-ray double crystal diffractometry study

ABSTRACTStrain shift coefficient measurements for longitudinal optical phonons in molecular beam epitaxy grown metastable pseudomorphic Si1−xGex layers on (100) Si (0 < x < 0.35) and Ge (0.80 < x < 1) are reported. Strain in partially relaxed annealed specimens was obtained by double-crystal x-ray diffractometry and the corresponding strain phonon shift was measured by Raman scattering spectroscopy. For epilayers grown on Si it was found that the epilayer Si-Si phonon frequency varies linearly with strain. The magnitude of the strain shift coefficient b however showed a small composition dependence varying from b ≈ -700 cm-1 at x = 0 to b ≈ -950 cm-1 at x = 0.35, corresponding to a stress factor τ = 0.40 + 0.57x: + 0.13x2 cm-1/kbar. For the Ge-Ge vibration mode in epilayers grown on Ge, b decreased from ∼-425 cm-1 at x = 1 to ∼-500 cm-1 at x = 0.8, corresponding to a stress factor τ ≈ 0.52 – 0.14x - 0.08x2 cm-1/kbar.

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Assessment of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-Ray Double Crystal Diffraction

MRS Proceedings ◽

10.1557/proc-138-539 ◽

1988 ◽

Vol 138 ◽

Cited By ~ 3

Author(s):

S. J. Miles ◽

G. S. Green ◽

B. K. Tanner ◽

M. A. G. Halliwell ◽

M. H. Lyons

Keyword(s):

Skew Angle ◽

Double Crystal ◽

X Ray ◽

Heteroepitaxial Layers

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Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Nondestructive evaluation of silicon‐on‐insulator substrates using x‐ray double crystal topography

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578194 ◽

1992 ◽

Vol 10 (4) ◽

pp. 1006-1011 ◽

Cited By ~ 1

Author(s):

David I Ma ◽

George J. Campisi ◽

Syed B. Qadri ◽

Martin C. Peckerar

Keyword(s):

Nondestructive Evaluation ◽

Silicon On Insulator ◽

Double Crystal ◽

X Ray

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Anisotropic Lattice Relaxation and its Mechanism of ZnSe Epilayer Grown on (001) GaAs Substrate by Molecular Beam Epitaxy

MRS Proceedings ◽

10.1557/proc-399-449 ◽

1995 ◽

Vol 399 ◽

Author(s):

C.S. Kim ◽

S.K. Noh ◽

H.J. Lee ◽

Y.K. Cho ◽

Y.I. Kim ◽

...

Keyword(s):

Dislocation Density ◽

Gaas Substrate ◽

Molecular Beam ◽

Rotation Angle ◽

Lattice Relaxation ◽

High Dislocation Density ◽

Sinusoidal Oscillation ◽

Double Crystal ◽

X Ray ◽

Anisotropic Lattice

ABSTRACTWe have investigated anisotropic lattice relaxation and its mechanism of ZnSe epitaxial layer grown on (001) GaAs substrate by MBE. Double-crystal X-ray rocking curves for (004), {115} and {404} reflections were measured as a function of the azimuthal rotation angle of the sample. We observed the sinusoidal oscillation of the FWHM of the epilayer peak for (004) reflections due to the asymmetric dislocation density along two orthogonal <110> directions, and the direction of the maximum FWHM corresponding to high dislocation density is along [110]. In addition, the strain along [110] is smaller than that along [1-10], indicating that the layer suffered anisotropic lattice relaxation. The direction of larger relaxation([l-10]) is not consistent with that of high dislocation density([110]). The results suggest that the asymmetry in dislocation density is not responsible for the anisotropic relaxation of the ZnSe epilayer.

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Comparison of the interdiffusion lengths in GaAs/Al0.35Ga0.65As multiple quantum wells determined from photoluminescence and double crystal X-ray rocking curve measurements

Applied Surface Science ◽

10.1016/s0169-4332(98)00271-2 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 238-242 ◽

Cited By ~ 1

Author(s):

Y.T Oh ◽

T.W Kang ◽

T.W Kim

Keyword(s):

Quantum Wells ◽

Multiple Quantum Wells ◽

Multiple Quantum ◽

Double Crystal ◽

Rocking Curve ◽

X Ray

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Generation of Defects and Strain by Ion Implantation in Ge (100) Single Crystals, and in Pseudomorphic GexSi1-x Films Grown on Si (100)

MRS Proceedings ◽

10.1557/proc-262-1079 ◽

1992 ◽

Vol 262 ◽

Cited By ~ 7

Author(s):

D. Y. C. Lie ◽

A. Vantomme ◽

F. Eisen ◽

M. -A. Nicolet ◽

V. Arbet-Engels ◽

...

Keyword(s):

Ion Implantation ◽

Single Crystals ◽

Room Temperature ◽

Defect Concentration ◽

Double Crystal ◽

X Ray ◽

Positive Strain ◽

Independent Coefficient ◽

The Relationship ◽

Si Ion Implantation

ABSTRACTWe have studied the damage and strain produced in Ge (100) single crystals by implantation of various doses of 300 keV 28Si ions at room temperature. The analyzing tools were x-ray double-crystal diffractometry, and MeV 4He channeling spectrometry. The damage induced by implantation produces positive strain in Ge (100). The maximum perpendicular strain and maximum defect concentration rise nonlinearly with increasing dose. These quantities are linearly related with a dose-independent coefficient of ∼ 0.013 for Ge (100) single crystals implanted at room temperature. The results are compared with those available for Si (100) self-implantation. We have also monitored the strain and defects generated in pseudomorphic Ge0.1Si0.9/Si (100) films induced by room temperature 28Si ion implantation. It is found that the relationship between the strain and defect concentration induced by ion implantation is no longer a simple linear one.

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