Deposition of Amorphous Hydrogenated Silicon (a-Si:H): in situ Gas Analysis by Time-of-Flight Mass Spectrometry

1999 ◽  
Vol 130 (1) ◽  
pp. 221-225
Author(s):  
Gudrun Andrä ◽  
Fritz Falk ◽  
Herbert Stafast ◽  
Ewa Witkowicz
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Gas Analysis ◽  
Hydrogenated Silicon ◽  
Flight Mass Spectrometry ◽  
Amorphous Hydrogenated Silicon

scholarly journals Untangling the Formation Mechanisms of Biorelevant Molecules in the ISM with Photoionization Reflectron Time-of-Flight Mass Spectrometry

2015 ◽  
Vol 11 (A29A) ◽  
pp. 305-306
Author(s):  
Marko Förstel ◽  
Ralf I. Kaiser
Keyword(s):  
Mass Spectrometry ◽  
Single Photon ◽  
Time Of Flight ◽  
Formation Mechanisms ◽  
Flight Mass Spectrometry ◽  
On Line ◽  
Temperature Programmed ◽  
In Situ Infrared Spectroscopy ◽  
Complex Organic

AbstractExploiting reflectron time of flight mass spectrometry coupled with single photon ionization of the subliming molecules (PI-ReTOF-MS) during the temperature programmed desorption (TPD) and combining these data with on line and in situ infrared spectroscopy (FTIR), a versatile experimental approach has been established to elucidate the formation pathways of complex organic molecules in interstellar analog ices upon interaction with ionizing radiation at astrophysically relevant temperatures as low as 5 K.

In Situ Study of Soot from the Combustion of a Biomass Pyrolysis Intermediate—Eugenol—and n-Decane Using Aerosol Time of Flight Mass Spectrometry

2010 ◽  
Vol 24 (1) ◽  
pp. 439-445 ◽  
Author(s):  
M. Teresa Baeza-Romero ◽  
Jacqueline M. Wilson ◽  
Emma M. Fitzpatrick ◽  
Jenny M. Jones ◽  
Alan Williams
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Biomass Pyrolysis ◽  
In Situ Study ◽  
Flight Mass Spectrometry

A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry

2005 ◽  
Vol 76 (10) ◽  
pp. 103701 ◽  
Author(s):  
A. Wetzel ◽  
A. Socoliuc ◽  
E. Meyer ◽  
R. Bennewitz ◽  
E. Gnecco ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Scanning Probe Microscopy ◽  
Time Of Flight ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Flight Mass Spectrometry

A novel gas analysis system for metallurgical materials based on time-of-flight mass spectrometry

2010 ◽  
Vol 294 (2-3) ◽  
pp. 77-82 ◽  
Author(s):  
Wei Gao ◽  
Zhengxu Huang ◽  
Huiqing Nian ◽  
Xuejing Shen ◽  
Peng Wang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Gas Analysis ◽  
Flight Mass Spectrometry ◽  
Analysis System
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