Modeling and simulation of cylindrical surrounding double-gate (CSDG) MOSFET with vacuum gate dielectric for improved hot-carrier reliability and RF performance
2016 ◽
Vol 15
(2)
◽
pp. 657-665
◽
2013 ◽
Vol 60
(6)
◽
pp. 1820-1827
◽
2017 ◽
Vol 38
(2)
◽
pp. 024001
◽
Keyword(s):