Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability

2012 ◽  
Vol 28 (5) ◽  
pp. 653-671
Author(s):  
Kemal Kulovic ◽  
Martin Margala
Keyword(s):  
Voltage Measurement ◽  
Embedded Test ◽  
Measurement Capability ◽  
Test Instrument

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits

2015 ◽  
Vol 25 (03) ◽  
pp. 1640014
Author(s):  
Florence Azaïs ◽  
Stéphane David-Grignot ◽  
Laurent Latorre ◽  
François Lefevre
Keyword(s):  
Integrated Circuits ◽  
Phase Noise ◽  
Digital Signature ◽  
Signal Acquisition ◽  
Rf Integrated Circuits ◽  
Embedded Test ◽  
Silicon Area ◽  
Test Instrument ◽  
On Chip ◽  
Minimal Hardware

This paper presents a digital embedded test instrument (ETI) for on-chip phase noise (PN) testing of analog/RF integrated circuits. The technique relies on 1–bit signal acquisition and dedicated processing to compute a digital signature related to the PN level. An appropriate algorithm based on on-the-fly processing of the 1-bit signal is defined in order to implement the BIST module with minimal hardware resources. Its implementation in CMOS 140[Formula: see text]nm technology occupies only 7,885[Formula: see text][Formula: see text]m2, which represents an extremely small silicon area. Hardware measurements are performed on an FPGA prototype that validates the proposed instrument.

Current Zero at Prospective Transient Recovery Voltage Measurement

2016 ◽  
Vol 136 (2) ◽  
pp. 170-174 ◽  
Author(s):  
Tadashi Koshizuka ◽  
Yasuhiko Taniguchi ◽  
Eiichi Haginomori ◽  
Hisatoshi Ikeda ◽  
Keisuke Udagawa
Keyword(s):  
Voltage Measurement ◽  
Transient Recovery Voltage ◽  
Recovery Voltage ◽  
Current Zero

Prospective Transient Recovery Voltage Measurement of Short Circuit Testing Circuit by Reverse Current Injection

2019 ◽  
Vol 139 (8) ◽  
pp. 522-526
Author(s):  
Kyoya Nonaka ◽  
Tadashi Koshizuka ◽  
Eiichi Haginomori ◽  
Hisatoshi Ikeda ◽  
Takeshi Shinkai ◽  
...  
Keyword(s):  
Short Circuit ◽  
Reverse Current ◽  
Current Injection ◽  
Voltage Measurement ◽  
Circuit Testing ◽  
Transient Recovery Voltage ◽  
Recovery Voltage

PENGEMBANGAN INSTRUMEN ASESMEN KINERJA DASAR TATA RIAS

2014 ◽  
Vol 11 (2) ◽  
Author(s):  
I Gede Sudirtha
Keyword(s):  
Performance Test ◽  
Research Data ◽  
Assessment Instrument ◽  
Assessment Process ◽  
Development Research ◽  
Validity And Reliability ◽  
Test Instrument ◽  
Scoring Rubrics ◽  
Data Collection Instrument ◽  
Empirical Tests

This study aims to develop a performance assessment instrument for Make up Training Subject in Beauty Education Program by appropriate validity and reliability procedure in thedevelopment of the assessment instrument as the assessment process and products. Thisresearch is a development research (R&D). The research focuses on the development ofassessment instrument for Makeup Training Subject. The aspects of research, data sources, techniques and instruments/data collection instrument, and validation and reliability of theinstrument used in the study conducted by interview, observation, and literature and documents.The data of this study is quantitative data, which was statistically analyzed due to relevant empirical testing (validation of instruments) that includes testing and content validity andinternal validity. Descriptive analyzes were undertaken to describe the research data. The results showed: 1) The design of the instrument Makeup Training Subject are developed through theneeds analysis. It is done through literature review and study of the course competencies byengaging a team of researchers. This study resulted in the instrument guidelines and assessment instrument completed with its scoring rubrics. The instrument comprising: a step of validityassessment is done through the stages: experts judgment, empirical tests to prove the validityand reliability of the instruments assessment. All the performance test instrument developed is

scholarly journals New Sensor for Medium- and High-Voltage Measurement

Energies ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4654
Author(s):  
Andrzej Wetula ◽  
Andrzej Bień ◽  
Mrunal Parekh
Keyword(s):  
Finite Element Method ◽  
Electronic Devices ◽  
Finite Element Method Simulation ◽  
Laboratory Model ◽  
Power Electronic ◽  
Proof Of Concept ◽  
Voltage Measurement ◽  
Medium Voltage ◽  
Narrow Frequency Band ◽  
Further Development

Measurements of medium and high voltages in a power grid are normally performed with large and bulky voltage transformers or capacitive dividers. Besides installation problems, these devices operate in a relatively narrow frequency band, which limits their usability in modern systems that are saturated with power electronic devices. A sensor that can be installed directly on a wire and can operate without a galvanic connection to the ground may be used as an alternative voltage measurement device. This type of voltage sensor can complement current sensors installed on a wire, forming a complete power acquisition system. This paper presents such a sensor. Our sensor is built using two dielectric elements with different permeability coefficients. A finite element method simulation is used to estimate the parameters of a constructed sensor. Besides simulations, a laboratory model of a sensor was built and tested in a medium-voltage substation. Our results provide a proof of concept for the presented sensor. Some errors in voltage reconstruction have been traced to an oversimplified data acquisition and transmission system, which has to be improved during the further development of the sensor.

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