Detection and identification of potential impurities activated by neutron irradiation of Czochralski silicon

1980 ◽  
Vol 20 (3) ◽  
pp. 384
1992 ◽  
Vol 262 ◽  
Author(s):  
G. M. Berezina ◽  
F. P. Kdrshunov ◽  
N. A. Sobolev ◽  
A. V. Voevodova ◽  
A. A. Stuk

ABSTRACTThe influence of the rapid thermal annealing (RTA) in comparison with that of the standard furnace annealing (FA) on the electrical parameters and photoluminescence (PL) of Czochralski silicon (Cz Si) subjected to neutron irradiation at various temperatures has been studied. The role of the irradiation temperature on the annealing behaviour of electrical parameters in Cz Si has been established. The possibility of getting neutron transmutation doped (NTD) Cz Si having the calculated resistivity by means of the RTA is shown.


2009 ◽  
Vol 6 (3) ◽  
pp. 669-676 ◽  
Author(s):  
Guifeng Chen ◽  
Yangxian Li ◽  
Caichi Liu

2003 ◽  
Vol 253 (1-4) ◽  
pp. 6-9 ◽  
Author(s):  
Y.X. Li ◽  
H.Y. Guo ◽  
B.D. Liu ◽  
T.J. Liu ◽  
Q.Y. Hao ◽  
...  

2009 ◽  
Vol 18 (1) ◽  
pp. 293-297 ◽  
Author(s):  
Chen Gui-Feng ◽  
Yan Wen-Bo ◽  
Chen Hong-Jian ◽  
Li Xing-Hua ◽  
Li Yang-Xian

Author(s):  
Robert C. Rau ◽  
Robert L. Ladd

Recent studies have shown the presence of voids in several face-centered cubic metals after neutron irradiation at elevated temperatures. These voids were found when the irradiation temperature was above 0.3 Tm where Tm is the absolute melting point, and were ascribed to the agglomeration of lattice vacancies resulting from fast neutron generated displacement cascades. The present paper reports the existence of similar voids in the body-centered cubic metals tungsten and molybdenum.


Author(s):  
C.D. Humphrey ◽  
T.L. Cromeans ◽  
E.H. Cook ◽  
D.W. Bradley

There is a variety of methods available for the rapid detection and identification of viruses by electron microscopy as described in several reviews. The predominant techniques are classified as direct electron microscopy (DEM), immune electron microscopy (IEM), liquid phase immune electron microscopy (LPIEM) and solid phase immune electron microscopy (SPIEM). Each technique has inherent strengths and weaknesses. However, in recent years, the most progress for identifying viruses has been realized by the utilization of SPIEM.


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