Method for the quantitative X-ray diffraction analysis of a single-phase sandwich-like crystalline film with a slightly varying lattice parameter

1984 ◽  
Vol 111 (3) ◽  
pp. 269-276
Author(s):  
Daniel Machajdík
2006 ◽  
Vol 301 ◽  
pp. 177-180 ◽  
Author(s):  
Yuichiro Kuroki ◽  
Tomoichiro Okamoto ◽  
Masasuke Takata

Copper aluminum disulfide (CuAlS2) powders were synthesized in an evacuated ampoule at elevated temperatures. X-ray diffraction analysis revealed that the powders heated at temperatures higher than 800oC were single-phase CuAlS2. In the cathodoluminescence (CL) spectra measured at room temperature, the powders heated at temperatures higher than 600oC exhibited a visible emission peak at approximately 1.8 eV and a distinct ultraviolet emission peak at 3.45 eV. The powder heated at 700oC showed the maximum intensity of ultraviolet emission which is considered to be associated with excitons.


2012 ◽  
Vol 508 ◽  
pp. 224-229 ◽  
Author(s):  
Takayuki Yanagida ◽  
Yoshisuke Futami ◽  
Noriaki Kawaguchi ◽  
Jan Pejchal ◽  
Yutaka Fujimoto ◽  
...  

ααΑαNd3+ 0.5% Doped Single Crystal LiCaAlF6 Scintillator Was Grown by the Micro-Pulling down (µ-PD) Method. Powder X-Ray Diffraction Analysis Was Done and the Grown Crystal Was a Single Phase LiCaAlF6. it Was Cut and Polished to the Physical Dimension of 1 × 2 × 7 mm3. in Transmittance Spectrum, Nd3+ 5d-4f Absorption Observed at 175 Nm and the Transmittance Became 80% at Wavelength Longer than 180 Nm. Excited by 160 Nm, Nd3+ 5d-4f Emission Appeared at 180 Nm. X-Ray Induced Radio-Luminescence Spectrum Showed the Similar Feature with the Photoluminescence One. when Coupled with PMT and Irradiated by 241Am α-Ray, the Absolute Light Yield Resulted 100 Ph/5.5 Mev α.


Author(s):  
А.В. Павленко ◽  
Д.В. Стрюков ◽  
Н.В. Тер-Оганесян

For the first time, thin films of NaNbO3 on a MgO(001) substrate, on which a SrRuO3 layer was previously deposited, were obtained by RF cathode sputtering in an oxygen atmosphere. According to x-ray diffraction analysis the films are single phase and single-crystalline. The lattice parameters in the tetragonal approximation for the NaNbO3 and SrRuO3 layers were: с(NaNbO3) = 0.3940(1) nm, a(NaNbO3) = 0.389(1) nm; с(SrRuO3) = 0.4004(1) nm, a(SrRuO3) = 0.392(3) nm. The unit cell deformation for NaNbO3 was ε33 = 0.007, ε11 = 0.002. Dielectric and piezoelectric measurements indicate that the films are in a ferroelectric state.


YMER Digital ◽  
2021 ◽  
Vol 20 (12) ◽  
pp. 333-340
Author(s):  
Sudhir Kulkarni ◽  

Lithium-Cadmium ferrites with general formula Li0.5-x/2 Fe2.5-x/2 Cdx O4 (with x = 0,0.1,0.2....,0.7) were prepared by standard ceramic method. X-ray diffraction studies confirms single phase formation and lattice parameters were calculated. The crystal structure is cubic and lattice parameter increases with increasing Cd content. The infrared absorption (IR) spectra of all the samples were recorded in the range 200-800 cm-1 at room temperature in the KBr medium. Lithium ferrite shows four principal bands and some shoulders have been observed. The force constants Kt and Ko were calculated using Waldron's analysis. Scanning electron microscopy studies shows increase in grain size up to x = 0.1 and then the grain size decreases with increase in cadmium content.


1995 ◽  
Vol 401 ◽  
Author(s):  
L.A. Knauss ◽  
J.M. Pond ◽  
J.S. Horwitz ◽  
C.H. Mueller ◽  
R.E. Treece ◽  
...  

AbstractThe effect of a post deposition anneal on the structure and dielectric properties of epitaxial Sr1−x, BaxTiO3 (SBT) thin films with x = 0.35, 0.50 and 0.60 has been measured. The films were grown by pulsed laser deposition on LaAlO3(001) substrates at 750°C in 350 mTorr of oxygen. The asdeposited films were single phase, (001) oriented with 0)-scan widths for the (002) reflection between 0.160 and 0.50'. The dielectric properties of the as-deposited films exhibit a broad temperature dependence and a peak which is as much as 50 K below the peak in bulk SBT. Also, the lattice parameter, as measured by x-ray diffraction, of the as-deposited films was larger than the bulk indicating strain in the films. The as-deposited films were annealed for 8 hours at 900°C in oxygen. The dielectric properties of the annealed films were closer to that of bulk SBT and the lattice parameter was closer to the bulk lattice parameter indicating a reduction of strain. Annealing of as-deposited films also resulted in an increased dielectric tuning without increased dielectric loss.


2010 ◽  
Vol 173 ◽  
pp. 167-172
Author(s):  
N. Shafiza Afzan Sharif ◽  
Sabar Derita Hutagalung ◽  
Zainal A. Ahmad

The properties of undoped and La-doped CaCu3Ti4O12 ceramics synthesized via solid state reaction under argon environment had been studied. It was found that La-doped CCTOs gave higher dielectric constant and lower dielectric loss than undoped CCTO. X-ray diffraction (XRD) analysis indicated that all of the sintered samples have single-phase cubic structure (space group ). A minor shifted was observed in the peak positions for La-doped samples, which are attributed to the lattice expansion. The lattice parameter obtained from XRD analysis is 7.348 Å for undoped CCTO and increases to 7.348 – 7.377 Å for La-doped CCTOs. The results proven that La ions have effectively substituted into the Ca site of CCTO.


1994 ◽  
Vol 364 ◽  
Author(s):  
Katherine C. Chen ◽  
Samuel M. Allen ◽  
James D. Livingston

AbstractTi-Cr alloys near the TiCr2 composition have been studied to determine the single-phase Laves field and the associated defects accompanying off-stoichiometry. A combination of metallography, x-ray diffraction, lattice parameter measurements, density measurements and electron microprobe analysis have been used to establish a narrow single-phase region extending towards Ti-rich compositions. All three Laves crystal structures (C14, C36 and C15) were found to exist at different temperatures. Hardness and fracture toughness values determined by Vickers microindentation were studied as a function of alloy composition. Effects of adding Fe, Nb, Mo, and V to TiCr2 on lattice parameter, crystal structure, hardness and fracture toughness are reported.


1998 ◽  
Vol 512 ◽  
Author(s):  
V. Ponnambalam ◽  
U. V. Varadaraju

ABSTRACTBaPbl-xBixO3 phases with 0.6⋚ x⋚ 1.0 were synthesized by high temperature solid state reaction. Powder X-ray diffraction measurements show that all compositions are in single phase. Linear variation of lattice parameter is observed in BaPb1-xBixO3 with change in x indicating the random distribution of Pb in Bi sites. The activation energies for conduction of phases with x=0.8−0.6 obtained from ρ −T plots are same suggesting that the band gap does not change for compositions with x-0.8−0.6. The low activation energy obtained for BaBiO3 can be attributed to the structure of the compound. S versus (1000/T) data of x=1.0−0.8 exhibit a two-slope behavior. The orthorhombic to cubic phase transition could be the possible reason for the high power factor values of BaBiO3.


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