1097. Electron Auger spectroscopy— method for investigation of surface phenomena

Vacuum ◽  
1972 ◽  
Vol 22 (9) ◽  
pp. 430
Keyword(s):  
Auger Spectroscopy ◽  
Spectroscopy Method ◽  
Surface Phenomena ◽  
Electron Auger Spectroscopy ◽  
Electron Auger

scholarly journals FORMATION OF MG2SI THIN FILMS ON SI (111) AND THEIR RESEARCH BY EOS AND EELS

2021 ◽  
pp. 30-34
Author(s):  
DMITRIY VLADIMIROVICH FOMIN ◽  
◽  
NIKITA SERGEEVICH NOVGORODTSEV ◽  
DMITRIY OLEGOVICH STRUKOV ◽  
ALEXEY VYACHESLAVOVICH POLYAKOV ◽  
...  
Keyword(s):  
Thin Film ◽  
Vacuum Chamber ◽  
Solid Phase ◽  
Auger Spectroscopy ◽  
Magnesium Silicide ◽  
Characteristic Energy ◽  
Electron Auger Spectroscopy ◽  
High Vapor ◽  
Electron Auger

The paper presents information on the results of the formation of a thin Mg2Si film on a silicon substrate by solid-phase epitaxy in an ultrahigh-vacuum chamber of the PHI model 590 device. There are a number of difficulties in the formation of magnesium silicide films due to the low condensation coefficient and high vapor pressure. Effective methods for the formation of Mg2Si are currently being sought. As a result of our experiment, a thin film was obtained, which was studied in-situ by the method of electron Auger spectroscopy and spectroscopy of characteristic energy losses by electrons. Analysis of the Auger electron spectrum showed the presence of magnesium and silicon atoms in the composition of the formed film. From the analysis of the EELS spectra, it was found that a thin film of silicide magnesium was formed.

STUDY OF COMPOSITION FILM SYSTEM PB-SE AND CHANGE OF STRUCTURE UNDER TEMPERATURE ACTION

2018 ◽  
Vol 20 (5-6) ◽  
pp. 129-140
Author(s):  
A. G. Razina ◽  
V. A. Kazakov ◽  
A. A. Ashmarin ◽  
V. D. Kochakov
Keyword(s):  
Photoelectron Spectroscopy ◽  
Solid Phase Synthesis ◽  
Solid Phase ◽  
Auger Spectroscopy ◽  
Structural Features ◽  
Phase Synthesis ◽  
X Ray ◽  
Electron Auger Spectroscopy ◽  
Temperature Action ◽  
Electron Auger

The Pb-Se film systems were obtained by solid-phase synthesis and investigated by Xray diffraction and X-ray photoelectron spectroscopy, electron Auger spectroscopy. It was found that the films are heterogeneous in structure and composition. To study the structural features under the influence of temperature, Raman spectra of samples at temperatures of 300 K and 373 K were investigated.

Sem/X-Ray Applications to the Forensic Science Field

1976 ◽  
Vol 34 ◽  
pp. 390-391
Author(s):  
K. Culbreth
Keyword(s):  
Forensic Science ◽  
Depth Of Field ◽  
Surface Phenomena ◽  
Criminal Cases ◽  
Forensic Evidence ◽  
Science Field ◽  
X Ray ◽  
Hit And Run ◽  
Evaluation Of Evidence ◽  
Scanning Electron

The introduction of scanning electron microscopy and energy dispersive x-ray analysis to forensic science has provided additional methods by which investigative evidence can be analyzed. The importance of evidence from the scene of a crime or from the personal belongings of a victim and suspect has resulted in the development and evaluation of SEM/x-ray analysis applications to various types of forensic evidence. The intent of this paper is to describe some of these applications and to relate their importance to the investigation of criminal cases.The depth of field and high resolution of the SEM are an asset to the evaluation of evidence with respect to surface phenomena and physical matches (1). Fig. 1 shows a Phillips screw which has been reconstructed after the head and shank were separated during a hit-and-run accident.

The many faces of STEM in materials science

1991 ◽  
Vol 49 ◽  
pp. 440-441
Author(s):  
John Silcox
Keyword(s):  
Materials Science ◽  
Auger Spectroscopy ◽  
Dark Field ◽  
High Tc Superconductors ◽  
High Tc ◽  
Acoustic Environment ◽  
Electromagnetic Vibration ◽  
The Many ◽  
Serial Mode

Determination of the microstructure and microchemistry of small features often provides the insight needed for the understanding of processes in real materials. In many cases, it is not adequate to use microscopy alone. Microdiffraction and microspectroscopic information such as EELS, X-ray microprobe analysis and Auger spectroscopy can all contribute vital parts of the picture. For a number of reasons, dedicated STEM offers considerable promise as a quantitative instrument. In this paper, we review progress towards effective quantitative use of STEM with illustrations drawn from studies of high Tc superconductors, compound semiconductors and metallization of H-terminated silicon.Intrinsically, STEM is a quantitative instrument. Images are acquired directly by detectors in serial mode which is particularly convenient for digital image acquisition, control and display. The VG HB501A at Cornell has been installed in a particularly stable electromagnetic, vibration and acoustic environment. Care has been paid to achieving UHV conditions (i.e., 10-10 Torr). Finally, it has been interfaced with a VAX 3200 work station by Kirkland. This permits, for example, the acquisition of bright field (or energy loss) images and dark field images simultaneously as quantitative arrays in perfect registration.

Design of a UHV STEM for Through-The-Lens Electron Spectroscopy

1990 ◽  
Vol 48 (2) ◽  
pp. 380-381
Author(s):  
A. J. Bleeker ◽  
P. Kruit
Keyword(s):  
Secondary Electron ◽  
High Vacuum ◽  
Secondary Electron Emission ◽  
Auger Spectroscopy ◽  
Scanning Transmission Electron Microscope ◽  
Point Of View ◽  
Ultra High Vacuum ◽  
Scanning Transmission ◽  
Auger Spectra ◽  
Coincidence Measurements

Combining of the high spatial resolution of a Scanning Transmission Electron Microscope and the wealth of information from the secondary electrons and Auger spectra opens up new possibilities for materials research. In a prototype instrument at the Delft University of Technology we have shown that it is possible from the optical point of view to combine STEM and Auger spectroscopy [1]. With an Electron Energy Loss Spectrometer attached to the microscope it also became possible to perform coincidence measurements between the secondary electron signal and the EELS signal. We measured Auger spectra of carbon aluminium and Argon gas showing energy resolutions better than 1eV [2]. The coincidence measurements on carbon with a time resolution of 5 ns yielded basic insight in secondary electron emission processes [3]. However, for serious Auger spectroscopy, the specimen needs to be in Ultra High Vacuum. ( 10−10 Torr ). At this moment a new setup is in its last phase of construction.

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