Composition, microstructure, and properties of crystalline molybdenum silicide thin films produced by annealing of amorphous Mo/Si multilayers

Vacuum ◽  
1989 ◽  
Vol 39 (5) ◽  
pp. 515-516
1988 ◽  
Vol 63 (10) ◽  
pp. 4960-4969 ◽  
Author(s):  
O. B. Loopstra ◽  
W. G. Sloof ◽  
Th. H. de Keijser ◽  
E. J. Mittemeijer ◽  
S. Radelaar ◽  
...  

2007 ◽  
Vol 121-123 ◽  
pp. 267-270 ◽  
Author(s):  
X. Wang ◽  
Z.Y. Li ◽  
X. Yu ◽  
S. Su ◽  
J. Li

The microstructures and properties of (Tb,Sm)CoSi/Cr series films have been investigated. All the samples were sputtered and annealed at 500 °C for 25 min in pure N2 atmosphere, and their microstructures and properties were examined. The effect on the magnetic properties of partial Sm substituted by Tb is discussed. The lattice matching media were examined. And the mechanisms of interactions among the grains and between the magnetic layers have been analyzed by comparing multi magnetic layer with the mono magnetic layer.


1985 ◽  
Vol 54 ◽  
Author(s):  
Albertus G. Dirks ◽  
Tien Tien ◽  
Janet M. Towner

ABSTRACTThe microstructure and properties of thin films depends strongly upon the alloy composition. A study was made of the metallurgical aspects of homogeneous Al alloy films, particularly the binary Al-Ti and the ternary Al-Ti-Si systems. Electrical resistivity, grain size morphology, second phase formation and electromigration have been studied as a function of the alloy composition and its heat treatment.


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