Quantitative chemical mapping: Spatial resolution

1992 ◽  
Vol 47 (1-3) ◽  
pp. 167-172 ◽  
Author(s):  
F.H. Baumann ◽  
M. Bode ◽  
Y. Kim ◽  
A. Ourmazd
Author(s):  
A. Ourmazd ◽  
F.H. Baumann ◽  
M. Bode ◽  
Y. Kim

Quantitative Chemical Mapping is an electron microscopic technique capable of revealing compositional variations in crystalline materials. It combines chemical lattice imaging which maps the sample composition, with vector pattern recognition, which quantifies the local information content of the image to measure the local sample composition. Here we briefly address the spatial resolution of this technique, assuming complete familiarity with its theoretical underpinnings.In chemical imaging, we are concerned with the way that a compositional inhomogeneity is imaged under conditions appropriate for chemical sensitivity, and how the pattern recognition algorithm extracts information from a chemical lattice image. The problem can be formulated as follows. Given a “chemical impulse” of a specific shape, such as a column of Al atoms imbedded in GaAs (approximating a δ-function), an abrupt interface (a θ-function), or a diffuse interface (e.g., with an error function profile), what is the shape of the impulse on the analyzed chemical image? Or, alternatively, what region of the sample contributes to the information content of an image unit cell? By reciprocity, these two formulations are equivalent.


The Analyst ◽  
2019 ◽  
Vol 144 (10) ◽  
pp. 3226-3238 ◽  
Author(s):  
Jitraporn Vongsvivut ◽  
David Pérez-Guaita ◽  
Bayden R. Wood ◽  
Philip Heraud ◽  
Karina Khambatta ◽  
...  

Coupling synchrotron IR beam to an ATR element enhances spatial resolution suited for high-resolution single cell analysis in biology, medicine and environmental science.


2019 ◽  
Vol 25 (S2) ◽  
pp. 1772-1773
Author(s):  
Blanka E. Janicek ◽  
Joshua G. Hinman ◽  
Jordan H. Hinman ◽  
Sang hyun Bae ◽  
Meng Wu ◽  
...  

Nano Letters ◽  
2006 ◽  
Vol 6 (6) ◽  
pp. 1202-1206 ◽  
Author(s):  
Christopher R. McNeill ◽  
Benjamin Watts ◽  
Lars Thomsen ◽  
Warwick J. Belcher ◽  
Neil C. Greenham ◽  
...  

1989 ◽  
Vol 163 ◽  
Author(s):  
A. Ourmazd ◽  
Y. Kim ◽  
M. Bode

AbstractWe apply quantitative chemical mapping techniques to study thermal interdiffusion and ion-implantation induced intermixing at single heterointerfaces at the atomic level. Our results show thermal interdiffusion to be strongly depth dependent. This is related to the need for the presence of native point defects (interstitials and vacancies) to bring about interdiffusion. Since their initial concentration in the bulk is negligible, the point defects must be injected at the surface and transported to the interface for interdiffusion to occur. In the case of ion-implanted samples, we find the passage of a single energetic ion through a sample at 77 K causes significant intermixing, even when the sample receives no subsequent thermal treatment.


1997 ◽  
Vol 3 (S2) ◽  
pp. 909-910
Author(s):  
A.P. Hitchcock ◽  
S.G. Urquhart ◽  
E.G. Rightor ◽  
W. Lidy ◽  
H. Ade ◽  
...  

Phase segregation is important in determining the physical and chemical properties of many complex polymers, including polyurethanes. Achieving a better understanding of the connections between formulation chemistry, the chemical nature of segregated phases, and the physical properties of the resulting polymer, has the potential to greatly advance the development of improved polyurethane materials. However, the sub-micron size of segregated features precludes their chemical analysis by most existing methods. Near edge X-ray absorption spectroscopy carried out with sub micron spatial resolution provides one of the few suitable means for quantitative chemical analysis (speciation) of individual segregated phases. We have used the NSLS and ALS scanning transmission x-ray microscopes (STXM) to record images and spectra of both model and real polyurethane polymers. Relative to energy loss spectroscopy in a transmission electron microscope, STXM has remarkable advantages with regard to a much lower radiation damage rates and much higher spectral resolution (∼0.1 eV at the C ls edge), with a spatial resolution (∼0.1 μm) adequate for many real world problems in polymer analysis.


Sign in / Sign up

Export Citation Format

Share Document