Failure analysis of bellows under external pressure

1994 ◽  
Vol 57 (3) ◽  
pp. 321-325 ◽  
Author(s):  
Yi Qian ◽  
Longgen Chen
Author(s):  
Xiao-li Shen ◽  
Sun-ting Yan ◽  
Fei Wang ◽  
Ming Zhang ◽  
Hao Ye ◽  
...  

Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.


2015 ◽  
pp. 138-146
Author(s):  
N. Rozinskaya ◽  
I. Rozinskiy

This article deals with the genesis of general trust and social capital in contemporary Russia, which faces the external pressure. The low level of general trust is noted, its economic, social and everyday life implications are considered, an explanation of Russia’s lower than in western Europe level of trust is provided. Considering society’s level of trust and social capital as externalia, the authors conclude that there is a necessity to "produce" trust intentionally. Promotion of collective charity is proposed as a mechanism of such "production". It is stressed that in order to activate the potential of trust in a society, there is a need for ideological and symbolic basis linked to its history. Russian People’s Unity Day, understood as the birthday of Russian civil society, is proposed to be used in this respect.


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