J-Integral Analysis of the Elastic Strain Fields of Ferrite Deformation Twins using Electron Backscatter Diffraction

Acta Materialia ◽

10.1016/j.actamat.2021.117203 ◽

2021 ◽

pp. 117203

Author(s):

Abdalrhaman Koko ◽

Elsiddig Elmukashfi ◽

Kalin Dragnevski ◽

Angus J. Wilkinson ◽

Thomas James Marrow

Keyword(s):

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Strain Fields ◽

Integral Analysis ◽

Deformation Twins ◽

Electron Backscatter ◽

Backscatter Diffraction

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J-Integral Analysis of the Elastic Strain Fields of Ferrite Deformation Twins Using Electron Backscatter Diffraction

SSRN Electronic Journal ◽

10.2139/ssrn.3860378 ◽

2021 ◽

Author(s):

Abdalrhaman Koko ◽

Elsiddig Elmukashfi ◽

Kalin Dragnevski ◽

Angus Wilkinson ◽

Thomas James Marrow

Keyword(s):

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Strain Fields ◽

Integral Analysis ◽

Deformation Twins ◽

Electron Backscatter ◽

Backscatter Diffraction

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The use of electron backscatter diffraction to measure the elastic strain fields in a misfit dislocation-free InGaAsP/InP heterostructure

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/40/23/008 ◽

2007 ◽

Vol 40 (23) ◽

pp. 7302-7305 ◽

Author(s):

L X Fan ◽

D L Guo ◽

F Ren ◽

X H Xiao ◽

G X Cai ◽

...

Keyword(s):

Misfit Dislocation ◽

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Strain Fields ◽

Electron Backscatter ◽

Backscatter Diffraction

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High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations

Ultramicroscopy ◽

10.1016/j.ultramic.2012.01.004 ◽

2012 ◽

Vol 114 ◽

pp. 82-95 ◽

Author(s):

T.B. Britton ◽

A.J. Wilkinson

Keyword(s):

High Resolution ◽

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Resolution Electron ◽

Electron Backscatter ◽

Backscatter Diffraction

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High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

Ultramicroscopy ◽

10.1016/j.ultramic.2005.10.001 ◽

2006 ◽

Vol 106 (4-5) ◽

pp. 307-313 ◽

Author(s):

Angus J. Wilkinson ◽

Graham Meaden ◽

David J. Dingley

Keyword(s):

High Resolution ◽

Strain Measurement ◽

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Diffraction Patterns ◽

Backscatter Diffraction

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Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

Ultramicroscopy ◽

10.1016/j.ultramic.2011.05.007 ◽

2011 ◽

Vol 111 (8) ◽

pp. 1395-1404 ◽

Author(s):

T.B. Britton ◽

A.J. Wilkinson

Keyword(s):

High Resolution ◽

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Resolution Electron ◽

Electron Backscatter ◽

Backscatter Diffraction

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Elastic strain tensor measurement using electron backscatter diffraction in the SEM

Journal of Electron Microscopy ◽

10.1093/jmicro/dfq043 ◽

2010 ◽

Vol 59 (S1) ◽

pp. S155-S163 ◽

Author(s):

D. J. Dingley ◽

A. J. Wilkinson ◽

G. Meaden ◽

P. S. Karamched

Keyword(s):

Elastic Strain ◽

Electron Backscatter Diffraction ◽

Strain Tensor ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Elastic Strain Tensor

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Characterization of Deformation Twins in Meteorites and Dynamically Loaded Ferrous Materials by Means Of Electron Backscatter Diffraction, EBSD

Practical Metallography ◽

10.3139/147.110317 ◽

2014 ◽

Vol 51 (11) ◽

pp. 765-784 ◽

Author(s):

M. Ecke ◽

F. Schwarz ◽

L. Krüger ◽

M. Wilke ◽

H. Heyse ◽

...

Keyword(s):

Electron Backscatter Diffraction ◽

Deformation Twins ◽

Electron Backscatter ◽

Dynamically Loaded ◽

Backscatter Diffraction

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Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment

Ultramicroscopy ◽

10.1016/j.ultramic.2019.04.006 ◽

2019 ◽

Vol 202 ◽

pp. 87-99 ◽

Author(s):

Tomohito Tanaka ◽

Angus J. Wilkinson

Keyword(s):

Pattern Matching ◽

Elastic Strain ◽

Crystal Orientation ◽

Electron Backscatter Diffraction ◽

Accuracy And Precision ◽

Electron Backscatter ◽

Precision Assessment ◽

Diffraction Patterns ◽

Strain Determination ◽

Backscatter Diffraction

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Investigation of Deformation Mechanisms in an Austenitic Mn-Steel by means of Scanning Electron Microscopy and Electron Backscatter Diffraction

Practical Metallography ◽

10.3139/147.110565 ◽

2019 ◽

Vol 56 (6) ◽

pp. 393-403

Author(s):

C. Hahn ◽

M. Lukas ◽

G. Ressel ◽

T. Klein ◽

R. Ebner

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Backscatter Diffraction ◽

Deformation Mechanisms ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Mn Steel ◽

Scanning Electron

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Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2012p0039 ◽

2012 ◽

Author(s):

Frank Altmann ◽

Jens Beyersdorfer ◽

Jan Schischka ◽

Michael Krause ◽

German Franz ◽

...

Keyword(s):

High Resolution ◽

Cross Section ◽

High Throughput ◽

Cross Sections ◽

Electron Backscatter Diffraction ◽

Grain Structure ◽

Electron Backscatter ◽

Section Surface ◽

Backscatter Diffraction ◽

Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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