The use of electron backscatter diffraction to measure the elastic strain fields in a misfit dislocation-free InGaAsP/InP heterostructure
2007 ◽
Vol 40
(23)
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pp. 7302-7305
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2006 ◽
Vol 106
(4-5)
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pp. 307-313
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2011 ◽
Vol 111
(8)
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pp. 1395-1404
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2010 ◽
Vol 59
(S1)
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pp. S155-S163
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