Low-voltage ZnO varistor fabricated by the solution-coating method

2008 ◽  
Vol 34 (7) ◽  
pp. 1697-1701 ◽  
Author(s):  
Q. Wang ◽  
Y. Qin ◽  
G.J. Xu ◽  
L. Chen ◽  
Y. Li ◽  
...  
2008 ◽  
Vol 55 ◽  
pp. 150-153
Author(s):  
Mun Ja Kim ◽  
Sung Min Park ◽  
Tae Young Lee ◽  
Sang Hyun Park ◽  
Jin Young Kim ◽  
...  

For the growth of Electroluminescent (EL) device market, the attention of many researchers is centered on improving the properties such as brightness, power consumption, device reliability, etc. The powder EL device is one of solutions for the easy mass production, the simplification of structure, and low cost. Although the powder process is the solution, that has the problem with the poor brightness than the film process. So, we focused on increasing the brightness of powder EL device. The emissive layer was made up the composites adding metal oxide nanopowder such as TiO2 and ZnO to powder phosphors. As the data of previous researcher, the TiO2 and ZnO had the different dominating traps by photovoltage measure, that is, TiO2 show hole traps, ZnO show electron traps [1]. The brightness of powder EL device proportions to the high electricfield formation. The TiO2 or ZnO in the powder phosphor composite can help the emission that may be advantageous to form high electricfield at low voltage. The EL devices with green ZnS phosphor were fabricated using spin coating method. The effect of TiO2 and ZnO on the luminescent property of EL device was investigated. The brightness was obtained as applied driving voltage at 400 Hz and frequency variation at 50 V.


2012 ◽  
Vol 512-515 ◽  
pp. 1263-1267
Author(s):  
Xing Gao ◽  
Guo You Gan ◽  
Li Hui Wang ◽  
Ji Kang Yan ◽  
Jian Hong Yi ◽  
...  

A novel fabricated technique, by feeding two sets of different ZnO formulations powder in a die by parts, molded only once to produce layered structure(including layer A and layer B) low-voltage ZnO varistor. The samples are examined by using energy dispersive X-ray spectroscopy (EDS), electron probe microanalysis (EPMA), scanning electron microscope (SEM) and DC electrical measurements. EDS and EPMA data indicate that doped elements only exists in layer A, The results of SEM indicate that secondary phases are formed at grain boundaries in layer A, not found in layer B. It is found that the electrical properties of low-voltage varistor are improved without reducing thickness and changing energy absorption capabilities. The higher nonlinearity coefficients, lower breakdown fields and leakage currents of layered structure low-voltage ZnO varistor, as compared to those of ZnO varistor fabricated from the conventional route. The improved current-voltage properties are attributed to the band structure difference in both sides grains, due to the different ion concentration and species in both sides of grain boundary. Layered structure varistor also has more simpler prepared technology than multilayer chip varistor.


1994 ◽  
Vol 41 (2) ◽  
pp. 193-195
Author(s):  
Atsushi Iga ◽  
Masahiro Ito ◽  
Hideyuki Okinaka

2011 ◽  
Vol 37 (1) ◽  
pp. 207-214 ◽  
Author(s):  
C. Tsonos ◽  
A. Kanapitsas ◽  
D. Triantis ◽  
C. Anastasiadis ◽  
I. Stavrakas ◽  
...  

Energies ◽  
2020 ◽  
Vol 13 (10) ◽  
pp. 2620
Author(s):  
Chunlong Zhang ◽  
Hongyan Xing ◽  
Chunying Li ◽  
Ran Cai ◽  
Dongbo Lv

In view of the problem that ZnO varistors are often subjected to thermal breakdown and deterioration due to lightning strikes in low-voltage power distribution systems, this article used a 8/20 µs multi-pulse surge current with a pulse time interval of 50 ms to perform shock experiments on ZnO varistors. SEM scanning electron microscope and an XRD diffractometer were used to analyze the structure of the grain boundary layer and the change of the crystalline phase material of ZnO varistor under the action of a multi-pulse current. The damage mechanism of ZnO varistor under the multi-pulse current was studied at the micro level. The results show that the average impact life of different types of ZnO varistor is significantly different. It was found that the types of trace elements and grain size in the grain boundary layer will affect the ability of ZnO varistor to withstand multi-pulse current. As the number of impulses increases, the grain structure of the ZnO varistor continues to degenerate. The unevenness of internal ion migration and the nonuniformity of the micro-grain boundary layer cause the local energy density to be too large and cause the local temperature rise to be too high, which eventually causes the internal grain boundary to melt through, and the local high temperature may cause the Bi element in the ZnO varistor to change in different crystal phases.


2021 ◽  
Vol 16 (1) ◽  
pp. 1-7
Author(s):  
Shaifudin Muhamad Syaizwadi ◽  
Mohd Sabri Mohd Ghazali ◽  
Wan Mohamad Kamaruzzaman Wan Mohamad Ikhmal ◽  
Mohd Anuar Muhamad Syahmi Hazim ◽  
Wan Abdullah Wan Rafizah ◽  
...  

Application of ZnO varistor at low voltage has increased significantly due to the high demands of low-voltage electronics with high nonlinearity characteristics and low leakage current. The varistor ceramics were developed via solid-state reaction method and the resultant sample was analyzed by means of SEM, EDS and XRD. The nonlinearity characteristics of ZnO varistor ceramics for different contents of cobalt oxide (Co3O4) at a given barium titanate (BaTiO3) amount were analyzed based on the J-E characteristics measurement. The increased value of nonlinear coefficient (α) equal to 4.8 was exhibited by the sample made with 12 wt.% BaTiO3 additive. As the concentration of dopant (Co3O4) incorporated was increased from 0.5 to 1.5 wt.%, the varistor voltage limit decreased from 8.9 V/mm to 7.0 V/mm, respectively. Additionally, the barrier height increased from 0.88 to 0.98 eV for 0.0 wt.% to 1.0 wt.% of Co3O4 concentration, respectively. The highest α of 7.2 was obtained at 0.5 wt.% Co3O4 and decreased with further doping content due to to the reduction of barrier height caused by the variation of electronic state at the grain boundaries.


1980 ◽  
Vol 51 (1) ◽  
pp. 765-768 ◽  
Author(s):  
F. A. Selim ◽  
T. K. Gupta ◽  
P. L. Hower ◽  
W. G. Carlson

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