Tensile failure strength and separation angle of FDM 3D printing PLA material: Experimental and theoretical analyses

Elevated temperature weakens the aluminosilicate framework, resulting in the reduction in the tensile failure strength, but an increase in the toughness.

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Tensile Failure Strength Analysis and Experimental Confirmation of Stitch Reinforced Composite of T-stiffened Structure

Polymers and Polymer Composites ◽

10.1177/096739111202000309 ◽

2012 ◽

Vol 20 (3) ◽

pp. 307-312 ◽

Cited By ~ 4

Author(s):

Qinghua Shi ◽

Di Dai ◽

Zhenghua Cao

Keyword(s):

Experimental Confirmation ◽

Tensile Failure ◽

Strength Analysis ◽

Failure Strength ◽

Reinforced Composite

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Influence of the FDM 3D Printing Process Parameters on In-Layer and the Inter-Layer Fracture under Tensile Failure

International Journal for Research in Applied Science and Engineering Technology ◽

10.22214/ijraset.2020.32446 ◽

2020 ◽

Vol 8 (12) ◽

pp. 215-222

Author(s):

Aman N Pathan

Keyword(s):

3D Printing ◽

Process Parameters ◽

Tensile Failure ◽

Printing Process

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Resolution in the scanning tunneling microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010008674x ◽

1991 ◽

Vol 49 ◽

pp. 488-489

Author(s):

R. J. Wilson ◽

D. D. Chambliss ◽

S. Chiang ◽

V. M. Hallmark

Keyword(s):

Scanning Tunneling Microscope ◽

Fundamental Principle ◽

Atomic Scale ◽

Lateral Resolution ◽

Scanning Tunneling ◽

Electronic Noise ◽

Vertical Resolution ◽

Tunneling Microscopy ◽

Spatial Profile ◽

Theoretical Analyses

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.

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Tensile Failure of 55-Nitinol Wire

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100113858 ◽

1975 ◽

Vol 33 ◽

pp. 46-47

Author(s):

F. I. Grace

Keyword(s):

Shape Memory ◽

Shape Memory Effect ◽

Memory Effect ◽

Stoichiometric Composition ◽

Tensile Failure ◽

Initial State ◽

Initial Shape ◽

Nitinol Wire ◽

Cscl Type ◽

Shear Transformation

An interest in NiTi alloys with near stoichiometric composition (55 NiTi) has intensified since they were found to exhibit a unique mechanical shape memory effect at the Naval Ordnance Laboratory some twelve years ago (thus refered to as NITINOL alloys). Since then, the microstructural mechanisms associated with the shape memory effect have been investigated and several interesting engineering applications have appeared.The shape memory effect implies that the alloy deformed from an initial shape will spontaneously return to that initial state upon heating. This behavior is reported to be related to a diffusionless shear transformation which takes place between similar but slightly different CsCl type structures.

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