scholarly journals Pre-harvest weed mapping of Cirsium arvense L. based on free satellite imagery – The importance of weed aggregation and image resolution

2021 ◽  
Vol 130 ◽  
pp. 126373
Author(s):  
Jesper Rasmussen ◽  
Saiful Azim ◽  
Jon Nielsen
2020 ◽  
Vol 9 (2) ◽  
Author(s):  
Tea Duplančić Leder ◽  
Nenad Leder ◽  
Martina Baučić

The paper gives a brief description of the remote sensing method used for the identification and extraction of water surfaces. Landsat 8 and Sentinel 2 satellite imagery was used to separate land from bodies of water in the complex karst area surrounding the Croatian Cetina River, flowing into the Adriatic Sea. Water indexing methods are presented in detail. The most frequently used water indices were selected: NDWI, MNDWI, AWEI_nsh, AWEI_sh, WRI and LSWI, and their results compared. The combination of satellite imagery and calculated water indices is concluded to be very useful for the identification and mapping of the area and banks of lakes, riverine zones, river mouths and the coastline in the coastal zone. Landsat 8 satellite imagery is slightly inferior to Sentinel 2 due to lower image resolution. The best results were obtained with the NDWI water index and the worst with LSWI.


2018 ◽  
Vol 20 (5) ◽  
pp. 983-999 ◽  
Author(s):  
J. Rasmussen ◽  
J. Nielsen ◽  
J. C. Streibig ◽  
J. E. Jensen ◽  
K. S. Pedersen ◽  
...  
Keyword(s):  

Antiquity ◽  
1996 ◽  
Vol 70 (269) ◽  
pp. 667-671 ◽  
Author(s):  
Martin J. F. Fowler

The spy satellites — by repute of the thriller writers — have such good image-resolution that they can read the letters on a vehicle licence-plate. A generation after LANDSAT imagery vividly showed broad ecological zones, higher resolution pictures are now being released of a quality to allow practical archaeological application. The example printed here illustrates the Stonehenge landscape — a little patch of southern England that is among the most photographed archaeologically anywhere.


2021 ◽  
Vol 12 ◽  
Author(s):  
Jing Zhang ◽  
Jerome Maleski ◽  
David Jespersen ◽  
F. C. Waltz ◽  
Glen Rains ◽  
...  

Weeds are a persistent problem on sod farms, and herbicides to control different weed species are one of the largest chemical inputs. Recent advances in unmanned aerial systems (UAS) and artificial intelligence provide opportunities for weed mapping on sod farms. This study investigates the weed type composition and area through both ground and UAS-based weed surveys and trains a convolutional neural network (CNN) for identifying and mapping weeds in sod fields using UAS-based imagery and a high-level application programming interface (API) implementation (Fastai) of the PyTorch deep learning library. The performance of the CNN was overall similar to, and in some classes (broadleaf and spurge) better than, human eyes indicated by the metric recall. In general, the CNN detected broadleaf, grass weeds, spurge, sedge, and no weeds at a precision between 0.68 and 0.87, 0.57 and 0.82, 0.68 and 0.83, 0.66 and 0.90, and 0.80 and 0.88, respectively, when using UAS images at 0.57 cm–1.28 cm pixel–1 resolution. Recall ranges for the five classes were 0.78–0.93, 0.65–0.87, 0.82–0.93, 0.52–0.79, and 0.94–0.99. Additionally, this study demonstrates that a CNN can achieve precision and recall above 0.9 at detecting different types of weeds during turf establishment when the weeds are mature. The CNN is limited by the image resolution, and more than one model may be needed in practice to improve the overall performance of weed mapping.


Author(s):  
D. L. Misell

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.


Author(s):  
Z. L. Wang ◽  
J. Bentley

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.


Author(s):  
K. Tsuno ◽  
Y. Harada ◽  
T. Sato

Magnetic domains of ferromagnetic amorphous ribbon have been observed using Bitter powder method. However, the domains of amorphous ribbon are very complicated and the surface of ribbon is not flat, so that clear domain image has not been obtained. It has been desired to observe more clear image in order to analyze the domain structure of this zero magnetocrystalline anisotropy material. So, we tried to observe magnetic domains by means of a back-scattered electron mode of high voltage scanning electron microscope (HVSEM).HVSEM method has several advantages compared with the ordinary methods for observing domains: (1) high contrast (0.9, 1.5 and 5% at 50, 100 and 200 kV) (2) high penetration depth of electrons (0.2, 1.5 and 8 μm at 50, 100 and 200 kV). However, image resolution of previous HVSEM was quite low (maximum magnification was less than 100x), because the objective lens cannot be excited for avoiding the application of magnetic field on the specimen.


Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.


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