Clariant completes colour range of “super transparent” pigment preparations, and unveils Hostatint UV range for radiation cured coating systems

2017 ◽  
Vol 2017 (8) ◽  
pp. 6-7
Keyword(s):  
2006 ◽  
Vol 36 (2) ◽  
pp. 145-148 ◽  
Author(s):  
Evgenii M Dianov ◽  
A A Rybaltovsky ◽  
S L Semenov ◽  
A N Gur'yanov ◽  
V F Khopin
Keyword(s):  

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Xueling Cheng ◽  
Yunshan Wang

AbstractOptoelectronic devices in the UV range have many applications including deep-UV communications, UV photodetectors, UV spectroscopy, etc. Graphene has unique exciton resonances, that have demonstrated large photosensitivity across the UV spectrum. Enhancing UV absorption in graphene has the potential to boost the performance of the various opto-electronic devices. Here we report numerical study of UV absorption in graphene on aluminum and magnesium hole-arrays. The absorption in a single-layer graphene on aluminum and magnesium hole-arrays reached a maximum value of 28% and 30% respectively, and the absorption peak is tunable from the UV to the visible range. The proposed graphene hybrid structure does not require graphene to be sandwiched between different material layers and thus is easy to fabricate and allows graphene to interact with its surroundings.


2021 ◽  
Vol 129 (5) ◽  
pp. 054301
Author(s):  
M. Hrytsaienko ◽  
M. Gallart ◽  
M. Ziegler ◽  
O. Crégut ◽  
S. Tamariz ◽  
...  

Author(s):  
Yujun Hou ◽  
Chun Jiang

Since the growth of single layer of Si has emerged, silicene became a potential candidate material to make up the disadvantage of graphene. In this paper, the complex surface conductivity is applied to characterize the properties of silicene and we investigate the optical characterization of silicene-dielectric interfaces from IR to far UV range. The silicene-Si and silicene-Ge interfaces along both parallel and perpendicular polarization directions of electromagnetic field with normal incidence are considered in this work. The optical properties of the silicene-dielectric systems proposed in this paper lay a foundation for the performance of complex silicene-based optoelectronic devices such as sensors, detectors, filters, UV absorbers and so on.


2021 ◽  
Author(s):  
Aliaksei Borisovets ◽  
Ilya Bruchkouski ◽  
Aliaksandr Svetashev ◽  
Aliaksandr Krasouski

<p>Regions with an expected low anthropogenic load are of particular interest for monitoring small gas components of the atmosphere. Under such conditions, the concentration of ozone is determined by natural processes. One of these regions is East Antarctica.</p><p>The experimental part of the research included:</p><p>- Complex of meteorological observations;</p><p>- Measurement of total ozone column (TOC) in the vertical column of the atmosphere;</p><p>- Monitoring of spectra, levels and doses of surface solar radiation;</p><p>The research was carried out in the areas where the Belarusian Antarctic expeditions were based: the stations “Mount Vechernaya” and “Progress”.</p><p>The measurements were carried out by a two-channel filter photometer PION-F and an ultraviolet spectroradiometer PION-UV, developed at the NOMREC. When determining the TOC values, the method was used, which consists in restoring the TOC values by analyzing the spectral distribution of the illumination density of the Earth's surface in the UV range. According to this method, the TOC values can be obtained using the ratio of illuminances at two wavelengths of the solar spectrum, one of which falls in the region of sufficiently strong absorption of atmospheric ozone, and the other is outside this region.</p><p>During the Belarusian Antarctic expeditions, a significant amount of experimental data was obtained (more than 100,000 spectra of energy illumination, more than 1,000 average daily values of TOC, etc.). The accumulated array of experimental data can be used to study theoretical problems and solve applied problems.</p><p>This paper presents a description of the dynamics of TOC in the atmosphere of East Antarctica during the period of seasonal expeditions 2014-2020.</p>


2015 ◽  
Vol 1084 ◽  
pp. 11-15
Author(s):  
Sergey P. Umnov ◽  
Oleg Kh. Asainov ◽  
Svetlana N. Popova ◽  
Aleksey N. Lemachko

High-reflectance aluminum films are widely used in applied optics. As part of this work, we deposited aluminum films on glass substrates by magnetron sputtering using argon ion beam assistance. The reflectivity of the films obtained was measured on the SF-256 spectrophotometer. The microstructure and topology of the films were examined with a transmission electron microscope (TEM), X-ray diffraction (XRD) and atomic force microscope (AFM). The studies have shown that the aluminum films deposited with ion assistance have higher reflectance in the UV range than the films formed by magnetron sputtering alone. The results of TEM and AFM measurements show that the geometric factor (crystallite size, surface roughness) is not the reason for the increase of reflectivity. X-ray diffraction analyses have shown a significant increase in microstress in the aluminum films deposited with ion assistance, which is caused by an increase in the defect density of the vacancy-type crystal structure. The results have shown that the increase in the density of crystal defects leads to an increase in reflectance in the UV range.


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