Electrical characterization of Au/n-GaN metal–semiconductor and Au/SiO2/n-GaN metal–insulator–semiconductor structures

2011 ◽  
Vol 509 (31) ◽  
pp. 8001-8007 ◽  
Author(s):  
V. Rajagopal Reddy ◽  
M. Siva Pratap Reddy ◽  
B. Prasanna Lakshmi ◽  
A. Ashok Kumar
Keyword(s):  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Semiconductor Structures

scholarly journals Electrical Characterization of Low Nitrogen Content Plasma Deposited and Rapid Thermal Annealed Al/SiNx:H/InP Metal-Insulator-Semiconductor Structures

2000 ◽  
Vol 39 (Part 1, No. 11) ◽  
pp. 6212-6215 ◽  
Author(s):  
Helena Castán ◽  
Salvador Dueñas ◽  
Juan Barbolla ◽  
Estefanía Redondo ◽  
Ignacio Mártil ◽  
...  
Keyword(s):  
Nitrogen Content ◽  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Semiconductor Structures ◽  
Low Nitrogen

Electrical Characterization of Deposited and Oxidized Ta2Si as Dielectric Film for SiC Metal-Insulator-Semiconductor Structures

2004 ◽  
Vol 457-460 ◽  
pp. 845-848 ◽  
Author(s):  
Amador Pérez-Tomás ◽  
Dominique Tournier ◽  
Josep Montserrat ◽  
Narcis Mestres ◽  
F. Sandiumenge ◽  
...  
Keyword(s):  
Dielectric Film ◽  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Semiconductor Structures
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