Thermal diffusion of chlorine in uranium dioxide studied by secondary ion mass spectrometry and X-ray absorption spectroscopy

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

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Aluminas modified with silica. Part 1.—An X-ray diffraction and secondary-ion mass-spectrometry study of the influence of preparation and thermal treatment on structure and surface composition

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19848001903 ◽

1984 ◽

Vol 80 (7) ◽

pp. 1903 ◽

Cited By ~ 9

Author(s):

Alan W. Espie ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Thermal Treatment ◽

Secondary Ion Mass Spectrometry ◽

Surface Composition ◽

X Ray Diffraction ◽

X Ray ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Cited By ~ 14

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

Secondary Ion

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Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

Journal of Cereal Science ◽

10.1016/j.jcs.2013.12.006 ◽

2014 ◽

Vol 59 (2) ◽

pp. 173-180 ◽

Cited By ~ 50

Author(s):

Bianca Kyriacou ◽

Katie L. Moore ◽

David Paterson ◽

Martin D. de Jonge ◽

Daryl L. Howard ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Fluorescence Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Rice Grain ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578851 ◽

1994 ◽

Vol 12 (3) ◽

pp. 671-676 ◽

Cited By ~ 4

Author(s):

P. W. Jahn ◽

F. M. Petrat ◽

D. Wolany ◽

M. Deimel ◽

T. Gantenfort ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

On Line ◽

Secondary Ion

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Ultrashallow Boron Junctions in Silicon Characterization by Secondary Ion Mass Spectrometry and Synchrotron Radiation Grazing Incidence X-Ray Fluorescence Techniques

ECS Meeting Abstracts ◽

10.1149/ma2009-02/22/2008 ◽

2009 ◽

Keyword(s):

Mass Spectrometry ◽

Synchrotron Radiation ◽

Secondary Ion Mass Spectrometry ◽

Grazing Incidence ◽

X Ray ◽

Fluorescence Techniques ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A Combined Investigation into the Effect of Ni/Mn/Co Ions on Lithium-Ion Battery Anodes Using X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry

ECS Meeting Abstracts ◽

10.1149/ma2014-01/2/245 ◽

2014 ◽

Keyword(s):

Mass Spectrometry ◽

Lithium Ion Battery ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Lithium Ion ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary-ion mass spectrometry and x-ray photo-electron spectroscopy analyses of -irradiated Bi-2212 superconductors

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/29/11/003 ◽

1996 ◽

Vol 29 (11) ◽

pp. 2745-2749 ◽

Cited By ~ 2

Author(s):

A Bhattacharyay ◽

P Rajasekar ◽

P Chakraborty ◽

S K Bandyopadhyay ◽

P Barat ◽

...

Keyword(s):

Mass Spectrometry ◽

Electron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Interaction of nitrogen and ammonia plasmas with polystyrene and polycarbonate studied by X-ray photoelectron spectroscopy, neutron activation analysis and static secondary ion mass spectrometry

Polymer ◽

10.1016/0032-3861(89)90380-7 ◽

1989 ◽

Vol 30 (1) ◽

pp. 40-44 ◽

Cited By ~ 133

Author(s):

J. Lub ◽

F.C.B.M. van Vroonhoven ◽

E. Bruninx ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

Neutron Activation Analysis ◽

Activation Analysis ◽

Neutron Activation ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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