Enhancement of magnetic moment of Er-implanted ZnO films by post-annealing in Ar and vacuum

2022 ◽  
Vol 306 ◽  
pp. 130901
Author(s):  
Qian Li ◽  
Heng Yuan ◽  
Mengdi Zhang ◽  
Weiqing Yan ◽  
Bin Liao ◽  
...  
AIP Advances ◽  
2018 ◽  
Vol 8 (1) ◽  
pp. 015015 ◽  
Author(s):  
Jian Gao ◽  
Wen-Jun Liu ◽  
Shi-Jin Ding ◽  
Hong-Liang Lu ◽  
David Wei Zhang

2012 ◽  
Vol 48 (4) ◽  
pp. 1614-1622 ◽  
Author(s):  
Boris Nijikovsky ◽  
Jacob J. Richardson ◽  
Magnus Garbrecht ◽  
Steven P. DenBaars ◽  
Wayne D. Kaplan

2013 ◽  
Vol 113 (17) ◽  
pp. 17C301 ◽  
Author(s):  
X. L. Wang ◽  
Q. Shao ◽  
C. W. Leung ◽  
A. Ruotolo
Keyword(s):  

2012 ◽  
Vol 503-504 ◽  
pp. 350-353
Author(s):  
Mao Nan ◽  
Chun Yang Kong ◽  
Guo Ping Qin ◽  
Hai Bo Ruan

The N-In codoped p-type ZnO films with preferential orientation along (002) plane have been fabricated on quartz glass substrates using radio frequency magnetron sputtering technique of ZnO:In2O3 powder target combining with N-implantation. The samples annealed at 700°C deserved the optimal properties, the best of which exhibits electrical characteristics with the hole concentration of 4.04×1018 cm-3, the lowest resistivity of 1.15 Ωcm and Hall mobility of about 1.35 cm2V-1s-1. The effects of post-annealing on the microstructure and electronic properties of the codoped ZnO films is analyzed via SEM, XRD, XPS and Hall measurements system, and the trend of carrier concentration with annealing time is discussed theoretically.


2008 ◽  
Vol 103 (2) ◽  
pp. 023911 ◽  
Author(s):  
Xiao-Li Li ◽  
Zhu-Liang Wang ◽  
Xiu-Fang Qin ◽  
Hai-Shun Wu ◽  
Xiao-Hong Xu ◽  
...  
Keyword(s):  

2012 ◽  
pp. 101-106
Author(s):  
Kwang Seok Jeong ◽  
Yu Mi Kim ◽  
Ho Jin Yun ◽  
Seung Dong Yang ◽  
Sang Youl Lee ◽  
...  

2005 ◽  
Vol 241 (3-4) ◽  
pp. 303-308 ◽  
Author(s):  
Z.B. Fang ◽  
Z.J. Yan ◽  
Y.S. Tan ◽  
X.Q. Liu ◽  
Y.Y. Wang

MRS Advances ◽  
2016 ◽  
Vol 1 (2) ◽  
pp. 163-168
Author(s):  
C. Davesnne ◽  
C. Frilay ◽  
P. Marie ◽  
C. Labbé ◽  
F. Ehre ◽  
...  

ABSTRACTCobalt doped ZnO (ZnO:Co) films with a 1 at% doping rate have been successfully grown on (100) oriented p type Si substrates by radiofrequency magnetron sputtering. Post annealing treatments at 973 K for various short periods have been carried out and structural, optical and electrical properties of the films have been investigated. Upon rapid annealing, the dopant distribution in the film has been found homogeneous. The annealing improves the (002) texture of the film and the mean column width increases with the annealing duration from 60 nm up to 95 nm. The lattice parameter of the ZnO:Co films decreases upon annealing and approaches that of bulk ZnO. The photoluminescence (PL) study reveals that the Co2+ ions can be excited directly or through a transfer mechanism from the matrix. The PL intensity decreases with the annealing time suggesting a diffusion process of the dopant impeding the Co2+ emission. At last, the electrical conductivity reaches values compatible with potential electroluminescent applications of the ZnO:Co films.


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