Atomic layer deposition of high capacitance density Ta2O5–ZrO2 based dielectrics for metal–insulator–metal structures
2010 ◽
Vol 87
(2)
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pp. 144-149
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2014 ◽
Vol 312
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pp. 112-116
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2011 ◽
Vol 29
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2019 ◽
Vol 37
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pp. 050903
2019 ◽
Vol 37
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pp. 011209
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2015 ◽
Vol 55
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pp. 016502
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2011 ◽
Vol 29
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pp. 01AC09
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