Precision defect engineering of metal/insulator/metal diodes using atomic layer deposition to localize Ni impurities in Al2O3 tunnel barriers

2021 ◽  
Vol 129 (14) ◽  
pp. 144502
Author(s):  
Konner E. K. Holden ◽  
Yitong Qi ◽  
John F. Conley
2017 ◽  
Vol 7 (3) ◽  
pp. 246 ◽  
Author(s):  
Golnaz Karbasian ◽  
Michael McConnell ◽  
Hubert George ◽  
Louisa Schneider ◽  
Matthew Filmer ◽  
...  

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