Reliability analysis of the fine pitch connection using anisotropic conductive film (ACF)

2006 ◽  
Vol 37 (7) ◽  
pp. 565-568 ◽  
Author(s):  
Chao-Ming Lin ◽  
Win-Jin Chang ◽  
Te-Hua Fang
2013 ◽  
Vol 302 ◽  
pp. 182-188
Author(s):  
Chao Ming Lin

Anisotropic conductive film (ACF), is a lead-free and fine-pitch interconnect materials that is commonly used in liquid crystal display (LCD) manufacturing to make and maintain the electrical and mechanical connections from the driver IC to the substrate. A key issue in the ACF technology is the packaging yield or failure probability, and performance of ACF’s material formula composition. This paper utilizes the V-shaped curve method to analyze the failure probability of composite ACF packages with a smart composition or a functional formula. In the proposed model, the probability of opening failures is modeled using a Poisson function, modified to take into account the average conception on the effective conductive area between opposing pads. Meanwhile, the probability estimation of bridging failures is based on the Box-Strip-Brick model between the neighboring pad pairs in the array. The results show the derived probability formulation can involve the probability conceptions of the composite ACF into a complete evaluation computation.


Author(s):  
Hoang-Vu Nguyen ◽  
Helge Kristiansen ◽  
Andreas Larsson ◽  
Erik Poppe ◽  
Rolf Johannessen ◽  
...  

2005 ◽  
Vol 297-300 ◽  
pp. 1828-1833
Author(s):  
Hideo Koguchi ◽  
Wisessint Attaporn ◽  
Kazuto Nishida

Anisotropic conductive film (ACF) is commonly used as underfill for flip chip assembly. The present study focuses on elastic recovery and stress distribution along the interfaces of particle-pads and underfill-pads associated with heat or a mechanical loading. In the same manner as the experimental process for ACF assemblies, ACF interconnection is simulated using FEM. Firstly, the properties of the nickel were determined by fitting FEM to the experimental results. After that, the nickel properties are used for ACF interconnection analysis. We found that delamination may also occur at a three-joint interface of a particle, a pad and an underfill at the lowest temperature during a heat cycle.


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