Current collapse degradation in GaN High Electron Mobility Transistor by virtual gate

2021 ◽  
pp. 105293
Author(s):  
D. Godfrey ◽  
D. Nirmal ◽  
L. Arivazhagan ◽  
D. Godwinraj ◽  
N. MohanKumar ◽  
...  
2019 ◽  
Vol 217 (7) ◽  
pp. 1900694
Author(s):  
Uiho Choi ◽  
Donghyeop Jung ◽  
Kyeongjae Lee ◽  
Taemyung Kwak ◽  
Taehoon Jang ◽  
...  

2006 ◽  
Vol 45 (No. 35) ◽  
pp. L932-L934 ◽  
Author(s):  
Li-Hsin Chu ◽  
Heng-Tung Hsu ◽  
Edward-Yi Chang ◽  
Tser-Lung Lee ◽  
Sze-Hung Chen ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document