Transient simulation and analysis of current collapse due to trapping effects in AlGaN/GaN high-electron-mobility transistor
1985 ◽
Vol 32
(6)
◽
pp. 1092-1102
◽
1998 ◽
Vol 31
(2)
◽
pp. 159-164
◽
2006 ◽
Vol 45
(No. 35)
◽
pp. L932-L934
◽