Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations

2016 ◽  
Vol 64 ◽  
pp. 403-408 ◽  
Author(s):  
U.M. Choi ◽  
F. Blaabjerg ◽  
S. Jørgensen ◽  
F. Iannuzzo ◽  
H. Wang ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Cycling Test ◽  
Power Cycling ◽  
Igbt Module ◽  
Temperature Swing

Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature

2010 ◽  
Vol 50 (9-11) ◽  
pp. 1810-1814 ◽  
Author(s):  
M. Tounsi ◽  
A. Oukaour ◽  
B. Tala-Ighil ◽  
H. Gualous ◽  
B. Boudart ◽  
...  
Keyword(s):  
Ambient Temperature ◽  
High Voltage ◽  
High Ambient Temperature ◽  
Cycling Test ◽  
Power Cycling ◽  
Igbt Module

Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs

2021 ◽  
pp. 114279
Author(s):  
M. Gerlach ◽  
R. Boldyrjew-Mast ◽  
F. Bruchhold ◽  
J. Lutz ◽  
T. Basler ◽  
...  
Keyword(s):  
Test Results ◽  
Cycling Test ◽  
Test Strategies ◽  
Power Cycling
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