Effective scan chain failure analysis method

2017 ◽  
Vol 76-77 ◽  
pp. 201-213 ◽  
Author(s):  
Etienne Auvray ◽  
Paul Armagnat ◽  
Luc Saury ◽  
Maheshwaran Jothi ◽  
Michael Brügel
Keyword(s):  
Failure Analysis ◽  
Analysis Method ◽  
Scan Chain

Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System

2014 ◽  
Author(s):  
Rommel Estores ◽  
Pascal Vercruysse ◽  
Karl Villareal ◽  
Eric Barbian ◽  
Ralph Sanchez ◽  
...  
Keyword(s):  
Data Analysis ◽  
Failure Analysis ◽  
Real Analysis ◽  
Failure Data ◽  
Analysis Methodology ◽  
Efficiency And Effectiveness ◽  
Scan Chain ◽  
On Chip ◽  
Analysis Environment ◽  
Selection Of

Abstract The failure analysis community working on highly integrated mixed signal circuitry is entering an era where simultaneously System-On-Chip technologies, denser metallization schemes, on-chip dissipation techniques and intelligent packages are being introduced. These innovations bring a great deal of defect accessibility challenges to the failure analyst. To contend in this era while aiming for higher efficiency and effectiveness, the failure analysis environment must undergo a disruptive evolution. The success or failure of an analysis will be determined by the careful selection of tools, data and techniques in the applied analysis flow. A comprehensive approach is required where hardware, software, data analysis, traditional FA techniques and expertise are complementary combined [1]. This document demonstrates this through the incorporation of advanced scan diagnosis methods in the overall analysis flow for digital functionality failures and supporting the enhanced failure analysis methodology. For the testing and diagnosis of the presented cases, compact but powerful scan test FA Lab hardware with its diagnosis software was used [2]. It can therefore easily be combined with the traditional FA techniques to provide stimulus for dynamic fault localizations [3]. The system combines scan chain information, failure data and layout information into one viewing environment which provides real analysis power for the failure analyst. Comprehensive data analysis is performed to identify failing cells/nets, provide a better overview of the failure and the interactions to isolate the fault further to a smaller area, or to analyze subtle behavior patterns to find and rationalize possible faults that are otherwise not detected. Three sample cases will be discussed in this document to demonstrate specific strengths and advantages of this enhanced FA methodology.

scholarly journals Possibilities of realization of the failure analysis method for machines

2001 ◽  
Vol 49 (4-5) ◽  
pp. 412-423
Author(s):  
Petar Gardijan
Keyword(s):  
Failure Analysis ◽  
Analysis Method

Yield and Failure Analysis of FinFET Source to Drain Leakage in 12nm Technology

2020 ◽  
Author(s):  
Felix Beaudoin ◽  
Satish Kodali ◽  
Rohan Deshpande ◽  
Wayne Zhao ◽  
Edmund Banghart ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Fault Localization ◽  
Detailed Characterization ◽  
Laser Stimulation ◽  
Emission Microscopy ◽  
Scan Chain ◽  
Multiple Samples ◽  
Tem Lamella ◽  
Diffusion Activation

Abstract Fault localization using both dynamic laser stimulation and emission microscopy was used to localize the failing transistors within the failing scan chain latch on multiple samples. Nanoprobing was then performed and the source to drain leakage in N-type FinFETs was identified. After extensive detailed characterization, it was concluded that the N-type dopant signal was likely due to projections from the source/drain regions included in the TEM lamella. Datamining identified the scan chain fail to be occurring uniquely for a specific family of tools used during source/drain implant diffusion activation. This paper discusses the processes involved in yield delta datamining of FinFET and its advantages over failure characterization, fault localization, nanoprobing, and physical failure analysis.

scholarly journals A failure analysis method for designing highly reliable product-service systems

2017 ◽  
Vol 29 (2) ◽  
pp. 143-160 ◽  
Author(s):  
Koji Kimita ◽  
Tomohiko Sakao ◽  
Yoshiki Shimomura
Keyword(s):  
Failure Analysis ◽  
Service Systems ◽  
Analysis Method ◽  
Product Service ◽  
Product Service Systems

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

2011 ◽  
Vol 301-303 ◽  
pp. 989-994
Author(s):  
Fei Wang ◽  
Da Wang ◽  
Hai Gang Yang
Keyword(s):  
Failure Analysis ◽  
Design For Testability ◽  
Pattern Generation ◽  
Diagnostic Process ◽  
High Quality ◽  
Analysis Process ◽  
Short Period ◽  
Multiple Scan ◽  
Scan Chain ◽  
Scan Chain Design

Scan chain design is a widely used design-for-testability (DFT) technique to improve test and diagnosis quality. However, failures on scan chain itself account for up to 30% of chip failures. To diagnose root causes of scan chain failures in a short period is vital to failure analysis process and yield improvements. As the conventional diagnosis process usually runs on the faulty free scan chain, scan chain faults may disable the diagnostic process, leaving large failure area to time-consuming failure analysis. In this paper, a SAT-based technique is proposed to generate patterns to diagnose scan chain faults. The proposed work can efficiently generate high quality diagnostic patterns to achieve high diagnosis resolution. Moreover, the computation overhead of proving equivalent faults is reduced. Experimental results on ISCAS’89 benchmark circuits show that the proposed method can reduce the number of diagnostic patterns while achieving high diagnosis resolution.

scholarly journals Failure analysis of storage tank component in LNG regasification unit using fault tree analysis method (FTA)

2017 ◽  
Author(s):  
Cukup Mulyana ◽  
Fajar Muhammad ◽  
Aswad H. Saad ◽  
Mariah ◽  
Nowo Riveli
Keyword(s):  
Failure Analysis ◽  
Storage Tank ◽  
Fault Tree ◽  
Fault Tree Analysis ◽  
Analysis Method ◽  
Tree Analysis

scholarly journals Parameters Assessment of the FMEA Method by Means of Fuzzy Logic

2018 ◽  
Vol 2 (Special edition 2) ◽  
pp. 123-132
Author(s):  
Jasminka Bonato ◽  
Martina Badurina ◽  
Julijan Dobrinić
Keyword(s):  
Fuzzy Logic ◽  
Failure Analysis ◽  
Failure Mode ◽  
Mathematical Function ◽  
Analysis Method ◽  
Effect Analysis ◽  
New Approach ◽  
System Failures ◽  
Numerical Indicator ◽  
Fmea Method

The paper aims at presenting the FMEA method based on the fuzzy technique, representing a new approach to the failure analysis and its effects on the observed system. The FMEA (Failure Mode and Effect Analysis) method has assigned the risks a coefficient i.e. a numerical indicator that very clearly defines the degree of risk. The risk is calculated as a mathematical function of RPN which depends on the effects S, probability O that some case will lead to a failure and to a probability that a failure D can not be detected before its effects are realized. RPN = S O D. The FMEA method, based on the fuzzy logic, makes a more reliable evaluation of the observed system failures possible.

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