Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System

2014 ◽  
Author(s):  
Rommel Estores ◽  
Pascal Vercruysse ◽  
Karl Villareal ◽  
Eric Barbian ◽  
Ralph Sanchez ◽  
...  
Keyword(s):  
Data Analysis ◽  
Failure Analysis ◽  
Real Analysis ◽  
Failure Data ◽  
Analysis Methodology ◽  
Efficiency And Effectiveness ◽  
Scan Chain ◽  
On Chip ◽  
Analysis Environment ◽  
Selection Of

Abstract The failure analysis community working on highly integrated mixed signal circuitry is entering an era where simultaneously System-On-Chip technologies, denser metallization schemes, on-chip dissipation techniques and intelligent packages are being introduced. These innovations bring a great deal of defect accessibility challenges to the failure analyst. To contend in this era while aiming for higher efficiency and effectiveness, the failure analysis environment must undergo a disruptive evolution. The success or failure of an analysis will be determined by the careful selection of tools, data and techniques in the applied analysis flow. A comprehensive approach is required where hardware, software, data analysis, traditional FA techniques and expertise are complementary combined [1]. This document demonstrates this through the incorporation of advanced scan diagnosis methods in the overall analysis flow for digital functionality failures and supporting the enhanced failure analysis methodology. For the testing and diagnosis of the presented cases, compact but powerful scan test FA Lab hardware with its diagnosis software was used [2]. It can therefore easily be combined with the traditional FA techniques to provide stimulus for dynamic fault localizations [3]. The system combines scan chain information, failure data and layout information into one viewing environment which provides real analysis power for the failure analyst. Comprehensive data analysis is performed to identify failing cells/nets, provide a better overview of the failure and the interactions to isolate the fault further to a smaller area, or to analyze subtle behavior patterns to find and rationalize possible faults that are otherwise not detected. Three sample cases will be discussed in this document to demonstrate specific strengths and advantages of this enhanced FA methodology.

Enabling Electro-Optical Failure Analysis within Extreme Compression Test Architecture

2016 ◽  
Author(s):  
Rudolf Schlangen ◽  
Jon Colburn ◽  
Joe Sarmiento ◽  
Bala Tarun Nelapatla ◽  
Puneet Gupta
Keyword(s):  
Failure Analysis ◽  
Compression Test ◽  
Test Pattern ◽  
Pattern Generation ◽  
Output Data ◽  
Test Compression ◽  
Test Loop ◽  
On Chip ◽  
Test Architecture

Abstract Driven by the need for higher test-compression, increasingly many chip-makers are adopting new DFT architectures such as “Extreme-Compression” (XTR, supported by Synopsys) with on-chip pattern generation and MISR based compression of chain output data. This paper discusses test-loop requirements in general and gives Advantest 93k specific guidelines on test-pattern release and ATE setup necessary to enable the most established EFA techniques such as LVP and SDL (aka DLS, LADA) within the XTR test architecture.

Lithium-ion Battery Degradation Mechanisms and Failure Analysis Methodology

2012 ◽  
Author(s):  
Bhanu Sood ◽  
Lucas Severn ◽  
Michael Osterman ◽  
Michael Pecht ◽  
Anton Bougaev ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Lithium Ion Batteries ◽  
Elevated Temperatures ◽  
Failure Process ◽  
Lithium Ion ◽  
Degradation Mechanisms ◽  
Analysis Methodology ◽  
Depth Of Discharge ◽  
Battery Degradation ◽  
Non Destructive

Abstract A review of the prevalent degradation mechanisms in Lithium ion batteries is presented. Degradation and eventual failure in lithium-ion batteries can occur for a variety of dfferent reasons. Degradation in storage occurs primarily due to the self-discharge mechanisms, and is accelerated during storage at elevated temperatures. The degradation and failure during use conditions is generally accelerated due to the transient power requirements, the high frequency of charge/discharge cycles and differences between the state-of-charge and the depth of discharge influence the degradation and failure process. A step-by-step methodology for conducting a failure analysis of Lithion batteries is presented. The failure analysis methodology is illustrated using a decision-tree approach, which enables the user to evaluate and select the most appropriate techniques based on the observed battery characteristics. The techniques start with non-destructive and non-intrusive steps and shift to those that are more destructive and analytical in nature as information about the battery state is gained through a set of measurements and experimental techniques.

Application of Conductive-AFM in Soft Failure Analysis

2017 ◽  
Author(s):  
Chuan Zhang ◽  
Yinzhe Ma ◽  
Gregory Dabney ◽  
Oh Chong Khiam ◽  
Esther P.Y. Chen
Keyword(s):  
Failure Analysis ◽  
Conductive Atomic Force Microscopy ◽  
Test Parameter ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Analysis Methodology ◽  
Soft Failure ◽  
Atomic Force ◽  
Test Conditions ◽  
Sensitive Characteristics

Abstract Soft failures are among the most challenging yield detractors. They typically show test parameter sensitive characteristics, which would pass under certain test conditions but fail under other conditions. Conductive-atomic force microscopy (CAFM) emerged as an ideal solution for soft failure analysis that can balance the time and thoroughness. By inserting CAFM into the soft failure analysis flow, success rate of such type of analysis can be significantly enhanced. In this paper, a logic chain soft failure and a SRAM local bitline soft failure are used as examples to illustrate how this failure analysis methodology provides a powerful and efficient solution for soft failure analysis.

Case Studies in Atomic Force Probe Analysis

2006 ◽  
Author(s):  
Randal Mulder ◽  
Sam Subramanian ◽  
Tony Chrastecky
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Light Emission ◽  
Electrical Characterization ◽  
Logic Circuits ◽  
Contrast Imaging ◽  
Atomic Force ◽  
Measuring Surface ◽  
Analysis Environment

Abstract The use of atomic force probe (AFP) analysis in the analysis of semiconductor devices is expanding from its initial purpose of solely characterizing CMOS transistors at the contact level with a parametric analyzer. Other uses found for the AFP include the full electrical characterization of failing SRAM bit cells, current contrast imaging of SOI transistors, measuring surface roughness, the probing of metallization layers to measure leakages, and use with other tools, such as light emission, to quickly localize and identify defects in logic circuits. This paper presents several case studies in regards to these activities and their results. These case studies demonstrate the versatility of the AFP. The needs and demands of the failure analysis environment have quickly expanded its use. These expanded capabilities make the AFP more valuable for the failure analysis community.

Device Selection for Failure Analysis of Chain Fails Using Diagnosis Driven Yield Analysis

2011 ◽  
Author(s):  
Chris Schuermyer ◽  
Brady Benware ◽  
Graham Rhodes ◽  
Davide Appello ◽  
Vincenzo Tancorre ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Yield Analysis ◽  
Analysis Methodology ◽  
Device Selection ◽  
Selection For ◽  
Random Defects

Abstract This work presents the first application of a diagnosis driven approach for identifying systematic chain fail defects in order to reduce the time spent in failure analysis. The zonal analysis methodology that is applied separates devices into systematic and random populations of chain fails in order to prevent submitting random defects for failure analysis. Two silicon case studies are presented to validate the production worthiness of diagnosis driven yield analysis for chain fails. The defects uncovered in these case studies are very subtle and would be difficult to identify with any other methodology.

Failure Analysis of Functional Failures in a Designed for FA SRAM

2004 ◽  
Author(s):  
Gil Garteiz
Keyword(s):  
Failure Analysis ◽  
Success Rate ◽  
Physical Analysis ◽  
Analysis Methodology

Abstract Designing devices for failure analisys (FA) is becoming increasingly critical as structure geometries and killer defects rapidly decrease in size. Naturally, devices that are designed for FA are much easier to analyze and have a higher FA success rate than those that are not. Several analyses of functional failures in a 0.18um CMOS SRAM are presented in this paper to demonstrate “Design For FA” usefulness and application. Physical analysis methodology is also discussed.

K-MEANS CLUSTERING ALGORITHM FOR SERVICE DATA ANALYSIS BASED ON CUSTOMERS COMBINATION

2018 ◽  
Vol 3 (1) ◽  
pp. 001
Author(s):  
Zulhendra Zulhendra ◽  
Gunadi Widi Nurcahyo ◽  
Julius Santony
Keyword(s):  
Data Mining ◽  
Data Analysis ◽  
Clustering Algorithm ◽  
Customer Complaints ◽  
Using Data ◽  
Clustering Data ◽  
Service Data ◽  
Selection Of

In this study using Data Mining, namely K-Means Clustering. Data Mining can be used in searching for a large enough data analysis that aims to enable Indocomputer to know and classify service data based on customer complaints using Weka Software. In this study using the algorithm K-Means Clustering to predict or classify complaints about hardware damage on Payakumbuh Indocomputer. And can find out the data of Laptop brands most do service on Indocomputer Payakumbuh as one of the recommendations to consumers for the selection of Laptops.

scholarly journals Towards Implementation of Big Data Concepts in a Pharmaceutical Company

2020 ◽  
Vol 10 (1) ◽  
pp. 343-356
Author(s):  
Snezana Savoska ◽  
Blagoj Ristevski
Keyword(s):  
Information Technology ◽  
Big Data ◽  
Data Analysis ◽  
Pharmaceutical Company ◽  
Big Data Analytics ◽  
Structured Interviews ◽  
Holistic View ◽  
Analysis Methodology ◽  
Decision Making Processes ◽  
Research Demands

AbstractNowadays, big data is a widely utilized concept that has been spreading quickly in almost every domain. For pharmaceutical companies, using this concept is a challenging task because of the permanent pressure and business demands created through the legal requirements, research demands and standardization that have to be adopted. These legal and standards’ demands are associated with human healthcare safety and drug control that demands continuous and deep data analysis. Companies update their procedures to the particular laws, standards, market demands and regulations all the time by using contemporary information technology. This paper highlights some important aspects of the experience and change methodology used in one Macedonian pharmaceutical company, which has employed information technology solutions that successfully tackle legal and business pressures when dealing with a large amount of data. We used a holistic view and deliverables analysis methodology to gain top-down insights into the possibilities of big data analytics. Also, structured interviews with the company’s managers were used for information collection and proactive methodology with workshops was used in data integration toward the implementation of big data concepts. The paper emphasizes the information and knowledge used in this domain to improve awareness for the needs of big data analysis to achieve a competitive advantage. The main results are focused on systematizing the whole company’s data, information and knowledge and propose a solution that integrates big data to support managers’ decision-making processes.

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