Structural and electrical properties of radio frequency magnetron sputtered tantalum oxide films: Influence of post-deposition annealing

2010 ◽  
Vol 13 (4) ◽  
pp. 245-251 ◽  
Author(s):  
S.V. Jagadeesh Chandra ◽  
Chel-Jong Choi ◽  
S. Uthanna ◽  
G. Mohan Rao
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