Machinability study of high speed steel for focused ion beam (FIB) milling process – An experimental investigation at micron/nano scale

2014 ◽  
Vol 38 (1) ◽  
pp. 168-173 ◽  
Author(s):  
Sanket N. Bhavsar ◽  
S. Aravindan ◽  
P. Venkateswara Rao
Keyword(s):  
Experimental Investigation ◽  
High Speed ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Speed Steel ◽  
Milling Process ◽  
Nano Scale

Experimental investigation of redeposition during focused ion beam milling of high speed steel

2012 ◽  
Vol 36 (3) ◽  
pp. 408-413 ◽  
Author(s):  
Sanket N. Bhavsar ◽  
Sivanandam Aravindan ◽  
P. Venkateswara Rao
Keyword(s):  
Experimental Investigation ◽  
High Speed ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Speed Steel ◽  
Focused Ion Beam Milling

Experimental Investigation at Relatively High Speed Scratching Induced by a Developed Diamond Tip

2016 ◽  
Vol 1136 ◽  
pp. 277-281
Author(s):  
Zhen Yu Zhang ◽  
Bo Ya Yuan ◽  
Si Ling Huang ◽  
Zhi Feng Shi
Keyword(s):  
Experimental Investigation ◽  
High Speed ◽  
Focused Ion Beam ◽  
Crack Formation ◽  
Ion Beam ◽  
Depth Of Cut ◽  
Precision Grinding ◽  
Normal Forces ◽  
193 Nm ◽  
Si Wafer

A diamond tip with included angle of 90° and fillet radius of 45 nm is developed combining precision grinding and focused ion beam. Relatively high speed scratching at 8.4 m/s induced by the developed diamond tip is conducted on silicon (Si) (111) plane using an ultraprecision grinder. Width at the onset of chip formation on a Si wafer is 193 nm. Width and depth at the onset of crack formation are 1125 and 94 nm, respectively. Calculated normal forces at the onset of chip and crack formations are 424 μN and 14 mN, respectively, corresponding to the depth of cut is 44 and 466 nm.

Nano-Scale Lateral Milling with Focused Ion Beam for Ultra-Smooth Optical Device Surface~!2009-12-16~!2010-02-18~!2010-04-21~!

2010 ◽  
Vol 2 (1) ◽  
pp. 51-58 ◽  
Author(s):  
Yeonjoon Park ◽  
SangJoon Park ◽  
Uhn Lee ◽  
Sang H. Choi
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Optical Device ◽  
Nano Scale

High-speed focused-ion-beam patterning for guiding the growth of anodic alumina nanochannel arrays

2003 ◽  
Vol 82 (8) ◽  
pp. 1281-1283 ◽  
Author(s):  
N. W. Liu ◽  
A. Datta ◽  
C. Y. Liu ◽  
Y. L. Wang
Keyword(s):  
High Speed ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Anodic Alumina ◽  
Ion Beam Patterning ◽  
Nanochannel Arrays

scholarly journals An Experimental Investigation on Bushing Geometrical Properties and Density in Thermal Frictional Drilling

2018 ◽  
Vol 8 (12) ◽  
pp. 2658
Author(s):  
Zülküf Demir ◽  
Cebeli Özek ◽  
Muhammed Bal
Keyword(s):  
Experimental Investigation ◽  
Aluminum Alloys ◽  
Wall Thickness ◽  
High Speed ◽  
High Speed Steel ◽  
Volume Ratio ◽  
Geometrical Properties ◽  
Friction Drilling ◽  
Tool Diameter ◽  
Geometrical Dimensions

In thermal friction drilling (TFD) operations, the geometrical dimensions of bushing shape, height and wall thickness are the most vital consequences, since these increase the connecting length and strength. In this paper, AA7075-T651 aluminum alloys with 2, 4, 6, 8, and 10 mm thicknesses were drilled with the TFD process in order to investigate density, volume ratio, and height and wall thickness of the bushings. The experiments were conducted at constant spindle speed and feed rate conditions by using High Speed Steel (HSS) conical tools of 5, 10, 15, and 20 mm in diameter. It was experimentally found that the bushing height and the wall thickness had a tendency to increase linearly with the increase in both material thickness and tool diameter. The effect of tool diameter was found to have more influence on the measurable values than the thickness of the drilled material. The density of the bushing changed trivially. Approximately 70–75 percent of the evacuated material formed the bushing shape in TFD operations.

Optimization Based Geometric Modeling of Nano/Micro Scale Ion Milling of Organic Materials

2009 ◽  
Author(s):  
Jing Fu ◽  
Sanjay B. Joshi
Keyword(s):  
Geometric Modeling ◽  
Focused Ion Beam ◽  
Organic Materials ◽  
Ion Beam ◽  
Target Material ◽  
Milling Process ◽  
Ion Milling ◽  
Flexible Tool ◽  
Water Ice ◽  
Micro Scale

Recently, Focused Ion Beam (FIB) instruments have begun be applied to organic materials such as polymers and biological systems. This provides a novel tool for sectioning biological samples for analysis, or microfabrication with environment friendly materials. The modeling of nano/micro scale geometry accurately sculptured by FIB milling is crucial for generating the milling plan and process control, and for computer simulation for prediction and visualization of the milled geometry. However, modeling of the ion milling process on compound materials, especially for high aspect ratio feature, is still difficult due to the complexity of target material, as well as multiple physical and chemical interactions involved. In this study, a comprehensive model of ion milling with organic targets is presented to address the challenges using a simulation based approach. This platform has also been validated by milling different features on water ice in a cryogenic environment, and the simulation and experiment results show great consistency. With the proliferation of nanotechnology to biomedical and biomaterial domains, the proposed approach is expected to be a flexible tool for various applications involving novel and heterogeneous milling targets.

Colour-tunable 50% strain sensor using surface-nanopatterning of soft materials via nanoimprinting with focused ion beam milling process

CIRP Annals ◽  
2019 ◽  
Vol 68 (1) ◽  
pp. 595-598 ◽  
Author(s):  
Ying-Jun Quan ◽  
Min-Soo Kim ◽  
Younggyun Kim ◽  
Sung-Hoon Ahn
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Strain Sensor ◽  
Soft Materials ◽  
Milling Process ◽  
Focused Ion Beam Milling

A131 Nano-scale sputtering behavior in Focused Ion Beam Processing via Large-Scale Molecular Dynamics Simulation

2006 ◽  
Vol 2006 (0) ◽  
pp. 17-18
Author(s):  
Shin-ichi Satake ◽  
Natsuki Inoue ◽  
Jun Taniguchi ◽  
Masahiko Shibahara ◽  
Tomoyuki Tsuchida ◽  
...  
Keyword(s):  
Molecular Dynamics ◽  
Molecular Dynamics Simulation ◽  
Large Scale ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Dynamics Simulation ◽  
Nano Scale

Structure analysis of nano-scale dual-step fabricated by Focused Ion Beam

2013 ◽  
Author(s):  
Chen-ying Wang ◽  
Zhuang-de Jiang ◽  
Shu-ming Yang ◽  
Wei-xuan Jing ◽  
Qi-jing Lin ◽  
...  
Keyword(s):  
Structure Analysis ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Nano Scale
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