In this work, nano-crystalline chromium oxide (Cr2O3) thin film was synthesized using the Sol-gel method. The thin film was deposited on a glass substrate at 50°C by using chromium nitrate, methanol, ethanol, polyvinyl alcohol with a magnetic stirrer device and a hot plate. Each deposited thin film annealed in the microwave oven at 200°C. The structure of the prepared thin film was examined by means of X-ray diffraction (XRD). The Shearer formula was used to calculate the size of the film granules. The scanning electron microscopy (SEM) was used to study the surface morphology. UV-VIS measurement was also carried out to study optical properties of a sample by recording transmittance and reflectance data in the range 341-800 nm wavelength. All the tests confirmed the existence of a thin layer of Cr2O3 on the glass substrates.
We have investigated the morphology and sensitivity characteristics of nanostructured ZnO thin film prepared by sol-gel method from different molarities of zinc nitrate hexahydrate and hexamethylenetetramine (HMT) solutions. ZnO thin film coated glass substrates were used to growth the ZnO structures and have been annealed at different temperatures. The morphology of the samples was observed by scanning electron microscopy (SEM) and their sensitivity characteristics were measured by using the I-V measurement. The SEM studies shows that the nanostructured ZnO was denser at higher molarities and I-V measurement demonstrates that the nanostructured ZnO having higher sensitivity at higher molarities and higher annealing temperatures.
Transparent thin films of Sn-doped ZnO (ZnO:Sn) were deposited onto silica glass substrates by the sol–gel method. The effect of different Sn doping on the crystallinity, structural, optical and electrical properties of ZnO:Sn thin films were investigated by XRD, SEM, UV-VIS spectrophotometer and four-point probe method respectively. Among all of ZnO:Sn thin films in this paper, Sn-doped with 2 at.% exhibited the best properties, the surface demonstrate an accumulative crystallization and hexagonal structure, with a high-preferential c-axis orientation, namely an average transmittance of 90% and the resistivity of 19.6 Ω·cm.
Characterizing Crystalline Chromium oxide Thin Film Growth by Sol-gel method on Glass Substrates