Surface modification of polyethylene by Ag+ and Au+ ion implantation observed by phase imaging atomic force microscopy

2012 ◽  
Vol 206 (19-20) ◽  
pp. 4242-4248 ◽  
Author(s):  
M. Nenadović ◽  
J. Potočnik ◽  
M. Ristić ◽  
S. Štrbac ◽  
Z. Rakočević
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Ion Implantation ◽  
Phase Imaging ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy Studies on Morphology and Distribution of Surface Modified Silica and Clay Fillers in an Ethylene-Octene Copolymer Rubber

2003 ◽  
Vol 76 (5) ◽  
pp. 1091-1105 ◽  
Author(s):  
Sudip Ray ◽  
Anil K. Bhowmick ◽  
S. Bandyopadhyay
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Aggregate Size ◽  
Rubber Matrix ◽  
Phase Imaging ◽  
Acrylate Monomer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ethylene Octene Copolymer ◽  
Surface Modified

Abstract Topographic and phase imaging in tapping mode atomic force microscopy (TMAFM) has been performed to investigate the effect of surface modification of silica and clay fillers on the morphology and the microdispersion of the filler particles in the rubber matrix. The above fillers have been modified by using surface coating agents like an acrylate monomer (trimethylolpropane triacrylate, TMPTA) or a silane coupling agent (triethoxy vinylsilane, TEVS) followed by electron beam modification at room temperature. Both unmodified and surface modified fillers have been incorporated in an ethylene-octene copolymer rubber. The phase images of the above composites elucidate the reduction in aggregate size due to the filler surface modification, which is more pronounced in the case of silane modification. The results obtained from the section analysis and the histogram of the filler distribution further corroborate the above findings. The corresponding topographic images are characterized by various statistical quantities like roughness parameters and two-dimensional power spectral density (2-D PSD). As compared to the control silica and clay filled rubbers, a noticeable reduction in the surface roughness is observed in the case of modified filled composites. Thus, the whole study based on AFM suggests that the surface modification of the above fillers significantly reduces the filler-filler interaction, which in turn reduces the filler aggregate size and helps in improving the filler dispersion.

scholarly journals Applications of Atomic Force Microscopy in Textiles

2015 ◽  
Vol 10 (1) ◽  
pp. 155892501501000
Author(s):  
Serpil Koral Koc
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Cross Sections ◽  
Phase Imaging ◽  
Cotton Wool ◽  
Synthetic Fibers ◽  
Force Microscopy ◽  
Fiber Properties ◽  
Atomic Force ◽  
Potential Applications

Potential applications of atomic force microscopy (AFM) in textiles are explained. For this purpose samples were carefully selected from both natural and synthetic fibers. Cotton, wool, conventional polyethylene terepthalate (PET), antibacterial PET, and antistatic PET were investigated by means of 3D topography imaging, phase imaging, and calculation of their Rq values. The distribution of the additives in the cross sections of antibacterial PET and antistatic PET were analyzed. Moreover, differences between inner and outer cross section of trilobal PET was observed by force spectroscopy. The results are discussed considering the fiber properties. It is concluded that AFM is a powerful tool to investigate different properties of textile fibers, and it gives valuable information.

Phase Contrast Imaging in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1275-1276
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Phase Changes ◽  
Phase Imaging ◽  
Phase Detection ◽  
Contrast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

Surface modification of MgO substrates from aqueous exposure: an atomic force microscopy study

1997 ◽  
Vol 292 (1-2) ◽  
pp. 96-102 ◽  
Author(s):  
S.A. Holt ◽  
C.F. Jones ◽  
G.S. Watson ◽  
A. Crossley ◽  
C. Johnston ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

GROWTH OF SiC NANOSTRUCTURES ON Si (100) USING LOW ENERGY CARBON ION IMPLANTATION AND ELECTRON BEAM RAPID THERMAL ANNEALING

2004 ◽  
Vol 03 (04n05) ◽  
pp. 425-430 ◽  
Author(s):  
A. MARKWITZ ◽  
S. JOHNSON ◽  
M. RUDOLPHI ◽  
H. BAUMANN
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Beam ◽  
Ion Implantation ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Low Energy ◽  
Silicon Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Implantation Fluence

A combination of 10 keV 13 C low energy ion implantation and electron beam rapid thermal annealing (EB-RTA) is used to fabricate silicon carbide nanostructures on (100) silicon surfaces. These large ellipsoidal features appear after EB-RTA at 1000°C for 15 s. Prior to annealing, the silicon surfaces are virgin-like flat. Atomic force microscopy was used to study the morphology of these structures and it was found that the diameter and number of nanoboulders are linearly dependent on the implantation fluence. Further, a linear relationship between nanoboulder diameter and spacing suggests crystal coarsening is a fundamental element in the growth mechanism.

Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

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