Thermal analysis combined with X-ray diffraction/Rietveld method, FT-IR and UV-vis spectroscopy: Structural characterization of the lanthanum and cerium (III) polycrystalline complexes
Keyword(s):
X Ray
◽
2014 ◽
Vol 809-810
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pp. 313-318
2014 ◽
Vol 70
(a1)
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pp. C1808-C1808
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Keyword(s):