A short review on thermal vapor sulfurization of semiconductor thin films for optoelectronic applications

The productions of the thin metallic chalcogenide films are of particular interest for the wide range of fabrication of the solar cells, sensors, photodiode arrays, photoconductors. Raman spectroscopy is used to measure the scattering radiation of a matter. Basically, the spectroscopic methods can be defined as the study of the interaction of electromagnetic radiation with a matter. It can be based on the phenomenon of absorption, fluorescence, emission or scattering. The observation of peaks supported the formation of amorphous or crystalline nature of the samples. In this short review, the authors had gathered some informations about the Raman studies of recently synthesized metal chalcogenide semiconductor thin films.

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Investigation of electrical and dielectric properties of antimony oxide (Sb2O4) semiconductor thin films for TCO and optoelectronic applications

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2013.02.006 ◽

2013 ◽

Vol 367 ◽

pp. 1-7 ◽

Cited By ~ 39

Author(s):

B. Ouni ◽

M. Haj Lakhdar ◽

R. Boughalmi ◽

T. Larbi ◽

A. Boukhachem ◽

...

Keyword(s):

Thin Films ◽

Dielectric Properties ◽

Antimony Oxide ◽

Semiconductor Thin Films ◽

Electrical And Dielectric Properties ◽

Optoelectronic Applications

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Optical Properties and Constants of Ga-doped ZnO Thin Films Grown on a Muscovite Mica Substrate for Optoelectronic Applications

Korean Journal of Metals and Materials ◽

10.3365/kjmm.2016.54.2.117 ◽

2016 ◽

Vol 54 (2) ◽

pp. 117-124

Author(s):

Jae-Young Leem ◽

Younggyu Kim

Keyword(s):

Thin Films ◽

Optical Properties ◽

Zno Thin Films ◽

Mica Substrate ◽

Muscovite Mica ◽

Doped Zno ◽

Optoelectronic Applications

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Quantitative Image Analysis of Fractal-like Thin Films of Organic Semiconductors

10.26434/chemrxiv.6223610.v1 ◽

2018 ◽

Author(s):

Weikun Zhu ◽

Erfan Mohammadi ◽

Ying Diao

Keyword(s):

Thin Film ◽

Thin Films ◽

Image Analysis ◽

Fractal Dimension ◽

Organic Semiconductors ◽

Film Growth ◽

Electronic Device ◽

Significant Control ◽

Semiconductor Thin Films ◽

Two Parameters

Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then employ this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C<sub>8</sub>-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C<sub>8</sub>-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

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