Defect and stress relaxation in HVPE-GaN films using high temperature reactively sputtered AlN buffer
2001 ◽
Vol 230
(3-4)
◽
pp. 381-386
◽
Keyword(s):
Keyword(s):
2005 ◽
Vol 198
(1-3)
◽
pp. 350-353
◽
2019 ◽
Vol 40
(2)
◽
pp. 303-306
◽
2013 ◽
Vol 328
◽
pp. 950-954
1993 ◽
Vol 57
(9)
◽
pp. 1027-1034