The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

2002 ◽  
Vol 188 (3-4) ◽  
pp. 381-385 ◽  
Author(s):  
Kenji Okamoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Electrostatic Force ◽  
Atomic Force

Electric Control of Friction on Silicon Studied by Atomic Force Microscope

NANO ◽  
2015 ◽  
Vol 10 (03) ◽  
pp. 1550038 ◽  
Author(s):  
Yan Jiang ◽  
Lili Yue ◽  
Boshen Yan ◽  
Xi Liu ◽  
Xiaofei Yang ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Bias Voltage ◽  
Electrostatic Force ◽  
Adhesion Forces ◽  
Friction Forces ◽  
Type Silicon ◽  
Atomic Force ◽  
Electric Control ◽  
Before And After ◽  
Track Line

We investigated friction on an n-type silicon surface using an atomic force microscope when a bias voltage was applied to the sample. Friction forces on the same track line were measured before and after the bias voltages were applied and it was found that the friction forces in n-type silicon can be tuned reversibly with the bias voltage. The dependence of adhesion forces between the silicon nitride tip and Si sample on the bias voltages approximately follows a parabolic law due to electrostatic force, which results in a significant increase in the friction force at an applied electric field.

Force measurement using an ac atomic force microscope

1990 ◽  
Vol 67 (9) ◽  
pp. 4045-4052 ◽  
Author(s):  
William A. Ducker ◽  
Robert F. Cook ◽  
David R. Clarke
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Atomic Force

scholarly journals Cellular Shear Adhesion Force Measurement and Simultaneous Imaging by Atomic Force Microscope

2017 ◽  
Vol 37 (1) ◽  
pp. 102-111 ◽  
Author(s):  
Yu Hou ◽  
Zuobin Wang ◽  
Dayou Li ◽  
Renxi Qiu ◽  
Yan Li ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Force Measurement ◽  
Simultaneous Imaging ◽  
Atomic Force

Progress toward Système International d'Unités traceable force metrology for nanomechanics

2004 ◽  
Vol 19 (1) ◽  
pp. 366-379 ◽  
Author(s):  
Jon R. Pratt ◽  
Douglas T. Smith ◽  
David B. Newell ◽  
John A. Kramar ◽  
Eric Whitenton
Keyword(s):  
Atomic Force Microscope ◽  
Electrostatic Force ◽  
Standard Uncertainty ◽  
National Standards ◽  
Force Balance ◽  
Traceability Chain ◽  
Relative Standard Uncertainty ◽  
Force Sensitivity ◽  
Atomic Force ◽  
Relative Standard

Recent experiments with the National Institute of Standards and Technology (NIST) Electrostatic Force Balance (EFB) have achieved agreement between an electrostatic force and a gravitational force of 10−5 N to within a few hundred pN/μN. This result suggests that a force derived from measurements of length, capacitance, and voltage provides a viable small force standard consistent with the Système International d’Unités. In this paper, we have measured the force sensitivity of a piezoresistive microcantilever by directly probing the NIST EFB. These measurements were linear and repeatable at a relative standard uncertainty of 0.8%. We then used the calibrated cantilever as a secondary force standard to transfer the unit of force to an optical lever–based sensor mounted in an atomic force microscope. This experiment was perhaps the first ever force calibration of an atomic force microscope to preserve an unbroken traceability chain to appropriate national standards. We estimate the relative standard uncertainty of the force sensitivity at 5%, but caution that a simple model of the contact mechanics suggests errors may arise due to friction.

Atomic force microscope studies of membranes: force measurement and imaging in electrolyte solutions

1997 ◽  
Vol 126 (1) ◽  
pp. 77-89 ◽  
Author(s):  
W. Richard Bowen ◽  
Nidal Hilal ◽  
Robert W. Lovitt ◽  
Adel O. Sharif ◽  
Peter M. Williams
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Electrolyte Solutions ◽  
Atomic Force
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