scholarly journals Time-resolved ionization measurements with intense ultrashort XUV and X-ray free-electron laser pulses

2019 ◽  
Vol 37 (2) ◽  
pp. 235-241 ◽  
Author(s):  
Victor Tkachenko ◽  
Martin Büscher ◽  
Hauke Höppner ◽  
Nikita Medvedev ◽  
Vladimir Lipp ◽  
...  
Keyword(s):  
Free Electron ◽  
Impact Ionization ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Index Of Refraction ◽  
Single Shot ◽  
Monte Carlo Code ◽  
Thermal Transitions ◽  
Time Jitter ◽  
X Ray

AbstractModern free-electron lasers (FEL) operating in XUV (extreme ultraviolet) or X-ray range allow an access to novel research areas. An example is the ultrafast ionization of a solid by an intense femtosecond FEL pulse in XUV which consequently leads to a change of the complex index of refraction on an ultrashort timescale. The photoionization and subsequent impact ionization resulting in electronic and atomic dynamics are modeled with our hybrid code XTANT(X-ray thermal and non-thermal transitions) and a Monte Carlo code XCASCADE(X-ray-induced electron cascades). The simulations predict the temporal kinetics of FEL-induced electron cascades and thus yield temporally and spatially resolved information on the induced changes of the optical properties. In a series of experiments at FERMI and LCLS, single shot measurements with spatio-temporal encoding of the ionization process have been performed by a correlation of the FEL pump pulse with an optical femtosecond probe pulse. An excellent agreement between the experiment and the simulation has been found. We also show that such kind of experiments forms the basis for pulse duration and arrival time jitter monitoring as currently under development for XUV-FELs.

scholarly journals All-optical single shot complete electric field measurement of extreme ultraviolet free electron laser pulses

Optica ◽  
2021 ◽  
Author(s):  
William Peters ◽  
Travis Jones ◽  
Anatoly Efimov ◽  
Emanuele Pedersoli ◽  
Laura Foglia ◽  
...  
Keyword(s):  
Electric Field ◽  
Free Electron ◽  
Field Measurement ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Single Shot ◽  
Electric Field Measurement ◽  
All Optical

scholarly journals Multiple application X-ray imaging chamber for single-shot diffraction experiments with femtosecond X-ray laser pulses

2014 ◽  
Vol 47 (1) ◽  
pp. 188-197 ◽  
Author(s):  
Changyong Song ◽  
Kensuke Tono ◽  
Jaehyun Park ◽  
Tomio Ebisu ◽  
Sunam Kim ◽  
...  
Keyword(s):  
Free Electron ◽  
Single Pulse ◽  
Laser Pulses ◽  
Atomic Scale ◽  
Single Shot ◽  
X Rays ◽  
Structural Investigations ◽  
X Ray ◽  
Multiple Application ◽  
X Ray Imaging

X-ray free-electron lasers (XFELs) provide intense (∼1012 photons per pulse) coherent X-rays with ultra-short (∼10−14 s) pulse lengths. X-rays of such an unprecedented nature have introduced new means of atomic scale structural investigations, and discoveries are still ongoing. Effective use of XFELs would be further accelerated on a highly adaptable platform where most of the new experiments can be realized. Introduced here is the multiple-application X-ray imaging chamber (MAXIC), which is able to carry out various single-pulse diffraction experiments including single-shot imaging, nanocrystallographic data acquisition and ultra-fast pump–probe scattering for specimens in solid, liquid and gas phases. The MAXIC established at the SPring-8 ångström compact free-electron laser (SACLA) has demonstrated successful applications in the aforementioned experiments, but is not limited to them. Also introduced are recent experiments on single-shot diffraction imaging of Au nanoparticles and serial crystallographic data collection of lysozyme crystals at SACLA.

scholarly journals Spectral monitoring at SwissFEL using a high-resolution on-line hard X-ray single-shot spectrometer

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Christian David ◽  
Gediminas Seniutinas ◽  
Mikako Makita ◽  
Benedikt Rösner ◽  
Jens Rehanek ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Reference Data ◽  
Diffraction Order ◽  
Laser Pulses ◽  
Single Shot ◽  
Spectral Measurements ◽  
X Ray ◽  
On Line ◽  
Spectral Monitoring

The performance and parameters of the online photon single-shot spectrometer (PSSS) at the Aramis beamline of the SwissFEL free-electron laser are presented. The device operates between the photon energies 4 and 13 keV and uses diamond transmission gratings and bent Si crystals for spectral measurements on the first diffraction order of the beam. The device has an energy window of 0.7% of the median photon energy of the free-electron laser pulses and a spectral resolution (full width at half-maximum) ΔE/E on the order of 10−5. The device was characterized by comparing its performance with reference data from synchrotron sources, and a parametric study investigated other effects that could affect the reliability of the spectral information.

Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA

2018 ◽  
Vol 25 (1) ◽  
pp. 68-71 ◽  
Author(s):  
Shigeki Owada ◽  
Kyo Nakajima ◽  
Tadashi Togashi ◽  
Tetsuo Kayatama ◽  
Makina Yabashi
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Imaging System ◽  
Laser Pulses ◽  
Single Shot ◽  
Simultaneous Operation ◽  
One Dimensional ◽  
X Ray ◽  
Arrival Timing ◽  
Optical Laser

Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL and optical laser pulses was successfully measured as a spatial position of the reflectivity change. The temporal resolution evaluated from the imaging system reaches ∼10 fs. This method requires only a small portion of the incident pulse energy, which enables the simultaneous operation of the arrival timing diagnostics and experiments by introducing a wavefront-splitting scheme.

scholarly journals The free-electron laser FLASH

2015 ◽  
Vol 3 ◽  
Author(s):  
Siegfried Schreiber ◽  
Bart Faatz
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Flash ◽  
Single Shot ◽  
Short Pulses ◽  
X Ray ◽  
Pump And Probe ◽  
User Facility ◽  
Diffraction Imaging

FLASH at DESY, Hamburg, Germany is the first free-electron laser (FEL) operating in the extreme ultraviolet (EUV) and soft x-ray wavelength range. FLASH is a user facility providing femtosecond short pulses with an unprecedented peak and average brilliance, opening new scientific opportunities in many disciplines. The first call for user experiments has been launched in 2005. The FLASH linear accelerator is based on TESLA superconducting technology, providing several thousands of photon pulses per second to user experiments. Probing femtosecond-scale dynamics in atomic and molecular reactions using, for instance, a combination of x-ray and optical pulses in a pump and probe arrangement, as well as single-shot diffraction imaging of biological objects and molecules, are typical experiments performed at the facility. We give an overview of the FLASH facility, and describe the basic principles of the accelerator. Recently, FLASH has been extended by a second undulator beamline (FLASH2) operated in parallel to the first beamline, extending the capacity of the facility by a factor of two.

scholarly journals In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

2018 ◽  
Vol 9 (1) ◽  
Author(s):  
Michael Schneider ◽  
Christian M. Günther ◽  
Bastian Pfau ◽  
Flavio Capotondi ◽  
Michele Manfredda ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Laser Pulses ◽  
Single Shot ◽  
X Ray

scholarly journals Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

2019 ◽  
Vol 9 (22) ◽  
pp. 4932 ◽  
Author(s):  
Toshiyuki Nishiyama ◽  
Christoph Bostedt ◽  
Ken R. Ferguson ◽  
Christopher Hutchison ◽  
Kiyonobu Nagaya ◽  
...  
Keyword(s):  
Free Electron ◽  
Laser Pulses ◽  
Clear Correlation ◽  
Single Shot ◽  
X Ray ◽  
X Ray Scattering ◽  
Matter Interaction ◽  
Light Matter Interaction ◽  
Diffraction Patterns ◽  
Xenon Clusters

X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses.

scholarly journals Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses

2007 ◽  
Vol 90 (13) ◽  
pp. 131108 ◽  
Author(s):  
P. Radcliffe ◽  
S. Düsterer ◽  
A. Azima ◽  
H. Redlin ◽  
J. Feldhaus ◽  
...  
Keyword(s):  
Free Electron ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Infrared Laser ◽  
Single Shot

scholarly journals Single-shot timing measurement of extreme-ultraviolet free-electron laser pulses

2008 ◽  
Vol 10 (3) ◽  
pp. 033026 ◽  
Author(s):  
Theophilos Maltezopoulos ◽  
Stefan Cunovic ◽  
Marek Wieland ◽  
Martin Beye ◽  
Armin Azima ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Single Shot ◽  
Timing Measurement
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