Validation of George and Robinson SE-I Signal Theorem. Implications for Ultrahigh Resolution Sem on Bulk Untilted Specimens
1982 ◽
Vol 40
◽
pp. 368-369
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Keyword(s):
In scanning electron microscopy on bulk untilted specimens topographic resolution in conventional “secondary electron imaging” (SEI) mode is very low; only in the order of several beam diameters. Extensive electron scattering within the specimen was thought to limit resolution since secondary electrons (SE) are collected irrespectively of their origin.
1989 ◽
Vol 47
◽
pp. 6-7
1970 ◽
Vol 28
◽
pp. 394-395
2004 ◽
Vol 216
(3)
◽
pp. 241-248
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1990 ◽
Vol 48
(1)
◽
pp. 374-375
1970 ◽
Vol 28
◽
pp. 114-115
1993 ◽
Vol 51
◽
pp. 1032-1033
1987 ◽
Vol 317
(24)
◽
pp. 1541-1541
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