Investigation of biogenic magnetite particles by high-resolution electron microscope

1984 ◽  
Vol 42 ◽  
pp. 216-217
Author(s):  
T. Matsuda ◽  
J. Endo ◽  
N. Osakabe ◽  
A. Tonomura ◽  
T. Arii
Keyword(s):  
High Resolution ◽  
Permanent Magnets ◽  
Fine Particles ◽  
Electron Holography ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Water Pond ◽  
High Resolution Electron Microscope ◽  
Magnetite Particles ◽  
Mössbauer Analysis

In 1975, Blakemore found aquatic bacteria that swim along earth's magnetic lines of force [1]. They have permanent magnets of iron-rich fine particles within them. Such particles were found by Mössbauer analysis to consist of magnetite in the case of magnetospirilla [2]. In addition, Towe et al confirmed by electron diffraction that the particles were crystalline [3]. The purpose of the present investigation is to determine the crystal and magnetic structure of these particles by both high-resolution lattice imaging and electron holography; however only the former is reported here.Magnetotactic bacteria were gathered in a fresh-water pond. The specimens were peanut-shaped, and approximately 3um in length. Transmission electron micrographs, such as that shown in Fig. 1, reveal that approximately 30 fine particles are aligned within each bacterium.

Scanning Device Combined with Conventional Electron Miscroscope

1971 ◽  
Vol 29 ◽  
pp. 28-29
Author(s):  
H. Koike ◽  
K. Ueno ◽  
M. Suzuki
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Basic Function ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Different Types ◽  
Specimen Area ◽  
High Resolution Electron Microscope ◽  
Scanning Em ◽  
Conventional Transmission Electron Microscope

A scanning image observation device has been developed for use in conjunction with the JEM-100B Electron Microscope, thereby enabling the microscope to function as a high resolution scanning EM in addition to its basic function as a conventioanl high resolution electron microscope. As a result, it is possible to observe three different types of image of the same specimen area; viz, secondary electron images, transmission scanning images and conventional transmission electron microscope images. It is also possible to detect strays and obsorbed electrons, so that, the combined instrument provides a means for obtaining a wealth of information about the specimen.

scholarly journals The Mechanism of {113} Defect Formation in Silicon: Clustering of Interstitial–Vacancy Pairs Studied by In Situ High-Resolution Electron Microscope Irradiation

2013 ◽  
Vol 19 (S5) ◽  
pp. 38-42 ◽  
Author(s):  
Ludmila I. Fedina ◽  
Se Ahn Song ◽  
Andrey L. Chuvilin ◽  
Anton K. Gutakovskii ◽  
Alexander V. Latyshev
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Point Defect ◽  
Defect Formation ◽  
Silicon Crystal ◽  
Equilibrium Structure ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Atomic Chains ◽  
High Resolution Electron Microscope

AbstractWe report the direct visualization of point defect clustering in {113} planes of silicon crystal using a transmission electron microscope, which was supported by structural modeling and high-resolution electron microscope image simulations. In the initial stage an accumulation of nonbonded interstitial–vacancy (I–V) pairs stacked at a distance of 7.68 Å along neighboring atomic chains located on the {113} plane takes place. Further broadening of the {113} defect across its plane is due to the formation of planar fourfold coordinated defects (FFCDs) perpendicular to chains accumulating I–V pairs. Closely packed FFCDs create a sequence of eightfold rings in the {113} plane, providing sites for additional interstitials. As a result, the perfect interstitial chains are built on the {113} plane to create an equilibrium structure. Self-ordering of point defects driven by their nonisotropic strain fields is assumed to be the main force for point defect clustering in the {113} plane under the existence of an energy barrier for their recombination.

An Analysis of Dissociation of Molecules in a High Resolution Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 486-487
Author(s):  
Mihir Parikh
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Cross Sections ◽  
Resolving Power ◽  
Peak Intensity ◽  
Molecular Film ◽  
Resolution Electron ◽  
Dissociation Cross Section ◽  
High Resolution Electron Microscope ◽  
The Stability

It is well known that the resolution of bio-molecules in a high resolution electron microscope depends not just on the physical resolving power of the instrument, but also on the stability of these molecules under the electron beam. Experimentally, the damage to the bio-molecules is commo ly monitored by the decrease in the intensity of the diffraction pattern, or more quantitatively by the decrease in the peaks of an energy loss spectrum. In the latter case the exposure, EC, to decrease the peak intensity from IO to I’O can be related to the molecular dissociation cross-section, σD, by EC = ℓn(IO /I’O) /ℓD. Qu ntitative data on damage cross-sections are just being reported, However, the microscopist needs to know the explicit dependence of damage on: (1) the molecular properties, (2) the density and characteristics of the molecular film and that of the support film, if any, (3) the temperature of the molecular film and (4) certain characteristics of the electron microscope used

Bright-Field Images (Ctem) of Phase Objects at High Resolution

1976 ◽  
Vol 34 ◽  
pp. 490-491 ◽  
Author(s):  
Sumio Iijima
Keyword(s):  
High Resolution ◽  
Electron Beam Irradiation ◽  
Fine Particles ◽  
High Resolution Electron Microscopy ◽  
Good Test ◽  
Resolution Electron ◽  
Single Crystal Films ◽  
Crystal Films ◽  
By Products ◽  
Test Objects

We have developed a technique to prepare thin single crystal films of graphite for use as supporting films for high resolution electron microscopy. As we showed elsewhere (1), these films are completely noiseless and therefore can be used in the observation of phase objects by CTEM, such as single atoms or molecules as a means for overcoming the difficulties because of the background noise which appears with amorphous carbon supporting films, even though they are prepared so as to be less than 20Å thick. Since the graphite films are thinned by reaction with WO3 crystals under electron beam irradiation in the microscope, some small crystallites of WC or WC2 are inevitably left on the films as by-products. These particles are usually found to be over 10-20Å diameter but very fine particles are also formed on the film and these can serve as good test objects for studying the image formation of phase objects.

Design of a Field-Emission Gun for the Phillips CM20/STEM microscope

1990 ◽  
Vol 48 (2) ◽  
pp. 100-101
Author(s):  
P.M. Mul ◽  
B.J.M. Bormans ◽  
L. Schaap
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Analytical Electron Microscopy ◽  
Emission Region ◽  
Attractive Alternative ◽  
Electron Holography ◽  
Field Emitter ◽  
Field Emitters ◽  
Resolution Electron ◽  
High Resolution Tem

The first Field Emission Guns (FEG) on TEM/STEM instruments were introduced by Philips in 1977. In the past decade these EM400-series microscopes have been very successful, especially in analytical electron microscopy, where the high currents in small probes are particularly suitable. In High Resolution Electron Holography, the high coherence of the FEG has made it possible to approach atomic resolution.Most of these TEM/STEM systems are based on a cold field emitter (CFE). There are, however, a number of disadvantages to CFE’s, because of their very small emission region: the maximum current is limited (a strong disadvantage for high-resolution TEM imaging) and the emission is unstable, requiring special measures to reduce the strong FEG-induced noise. Thermal field emitters (TFE), i.e. a zirconiated field emitter source operating in the thermal or Schottky mode, have been shown to be a viable and attractive alternative to CFE’s. TFE’s have larger emission regions, providing much higher maximum currents, better stability, and reduced sensitivity to vacuum conditions as well as mechanical and electrical interferences.

High Resolution Transmission Electron Microscopy of an automobile catalytic converter

1990 ◽  
Vol 48 (4) ◽  
pp. 242-243
Author(s):  
Jan-Olle Malm ◽  
Jan-Olov Bovin
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Catalytic Converter ◽  
Active Material ◽  
Image Intensifier ◽  
High Resolution Electron Microscopy ◽  
Detailed Knowledge ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Atomic Surface

Understanding of catalytic processes requires detailed knowledge of the catalyst. As heterogeneous catalysis is a surface phenomena the understanding of the atomic surface structure of both the active material and the support material is of utmost importance. This work is a high resolution electron microscopy (HREM) study of different phases found in a used automobile catalytic converter.The high resolution micrographs were obtained with a JEM-4000EX working with a structural resolution better than 0.17 nm and equipped with a Gatan 622 TV-camera with an image intensifier. Some work (e.g. EDS-analysis and diffraction) was done with a JEM-2000FX equipped with a Link AN10000 EDX spectrometer. The catalytic converter in this study has been used under normal driving conditions for several years and has also been poisoned by using leaded fuel. To prepare the sample, parts of the monolith were crushed, dispersed in methanol and a drop of the dispersion was placed on the holey carbon grid.

Characterisation of planar crystal defects in Y2Fe17Cx (0.6 ≤ x ≤ 1.6) magnetic material by High Resolution Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 774-775
Author(s):  
W. Coene ◽  
F. Hakkens ◽  
T.H. Jacobs ◽  
K.H.J. Buschow
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Permanent Magnets ◽  
Annealing Treatment ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
Ordered Structure ◽  
X Ray ◽  
Planar Crystal ◽  
Resolution Electron

Intermetallic compounds of the type RE2Fe17Cx (RE= rare earth element) are promising candidates for permanent magnets. In case of Y2Fe17Cx, the Curie temperature increases from 325 K for x =0 to 550 K for x = 1.6 . X ray and electron diffraction reveal a carbon - induced structural transformation in Y2Fe17Cx from the hexagonal Th2Ni17 - type (x < 0.6 ) to the rhombohedral Th2Zn17 - type ( x ≥ 0.6). Planar crystal defects introduce local sheets of different magnetic anisotropy as compared with the ordered structure, and therefore may have an important impact on the coercivivity mechanism .High resolution electron microscopy ( HREM ) on a Philips CM30 / Super Twin has been used to characterize planar crystal defects in rhombohedral Y2Fe17Cx ( x ≥ 0.6 ). The basal plane stacking sequences are imaged in the [100] - orientation, showing an ABC or ACB sequence of Y - atoms and Fe2 - dumbbells, for both coaxial twin variants, respectively . Compounds resulting from a 3 - week annealing treatment at high temperature ( Ta = 1000 - 1100°C ) contain a high density of planar defects.

Computer-Controlled Hrem Alignment Using Automated Diffractogram Analysis

1990 ◽  
Vol 48 (1) ◽  
pp. 532-533
Author(s):  
G.Y. Fan ◽  
O.L. Krivanek
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
The Other ◽  
Full Information ◽  
Resolution Electron ◽  
Skilled Operator ◽  
Automatic Alignment ◽  
High Resolution Electron Microscope ◽  
Computer Controlled ◽  
Recorded Image

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.

High-resolution electron holography with the CM30FEG-special Tübingen

1994 ◽  
Vol 54 (2-4) ◽  
pp. 310-316 ◽  
Author(s):  
H. Lichte ◽  
W.D. Rau
Keyword(s):  
High Resolution ◽  
Electron Holography ◽  
Resolution Electron
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