Low voltage scanning electron microscopy of interplanetary dust particles

Author(s):  
D.F. Blake ◽  
T.W. Reilly ◽  
D.E. Brownlee ◽  
T.E. Bunch

Interplanetary Dust Particles (IDPs) are a relatively new class of extraterrestrial materials which are collected by high-flying aircraft in the stratosphere. The particles, ∼1.0-50 μm in size, enter the earth's atmosphere at ballistic velocities, but are sufficiently small to be decelerated without burning up. IDPs commonly have solar elemental abundances, and are thoughfto have undergone very little differentiation since the formation of the solar system. While these materials are called “particles,” they are in fact aggregates of a variety of mineral phases, glass, and carbonaceous material. Grains within IDPs commonly range from a few microns to a few tens of nanometers. The extraterrestrial origin of IDPs has been established by the discovery of solar flare tracks in some mineral grains, and recent D/H isotopic ratios recorded from individual particles. The source and formational history of the particles is a topic of active research. At present, the primary means of screening and classifying IDPs is Scanning Electron Microscopy, although a variety of electron microbeam and X-ray techniques is used for subsequent analysis.

2010 ◽  
Vol 9 (3) ◽  
pp. 183-189 ◽  
Author(s):  
Kani Rauf ◽  
Anthony Hann ◽  
Max Wallis ◽  
Chandra Wickramasinghe

AbstractInterplanetary dust particles (IDPs) were recovered from the stratosphere by a cryosampler flown below a balloon flying at altitudes of 20–41 km. The present study uses high-resolution scanning electron microscopy (SEM) and ultraviolet-visible (UV-Vis) spectrophotometry to examine fresh samples collected at 38–41 km. The SEM observations confirm the presence of 7–32 μm sized clusters of coccoidal (0.4–1.3 μm in diameter) and rod-shaped (0.6–2.5 μm in length) objects as components of the IDP complex. Many single globules (1.6–9.0 μm in diameter) are also observed, some of which exhibit a rough surface with filamentous features of variable lengths. The spectrophotometry of the particles in aggregate reveals a prominent peak centred at 216 nm, which is remarkably similar to that of diatoms and close to the UV astronomical feature of 217.5 nm that has been identified as the spectral characteristic of aromatic hydrocarbons. The evidence presented here suggests that the stratospheric particles are IDPs comprising an assortment of materials among which are included microfossil-like features in variable sizes and forms, such as coccoids, rods and filaments.


Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.


Author(s):  
Arthur V. Jones

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.


Author(s):  
W.W. Adams ◽  
G. Price ◽  
A. Krause

It has been shown that there are numerous advantages in imaging both coated and uncoated polymers in scanning electron microscopy (SEM) at low voltages (LV) from 0.5 to 2.0 keV compared to imaging at conventional voltages of 10 to 20 keV. The disadvantages of LVSEM of degraded resolution and decreased beam current have been overcome with the new generation of field emission gun SEMs. In imaging metal coated polymers in LVSEM beam damage is reduced, contrast is improved, and charging from irregularly shaped features (which may be unevenly coated) is reduced or eliminated. Imaging uncoated polymers in LVSEM allows direct observation of the surface with little or no charging and with no alterations of surface features from the metal coating process required for higher voltage imaging. This is particularly important for high resolution (HR) studies of polymers where it is desired to image features 1 to 10 nm in size. Metal sputter coating techniques produce a 10 - 20 nm film that has its own texture which can obscure topographical features of the original polymer surface. In examining thin, uncoated insulating samples on a conducting substrate at low voltages the effect of sample-beam interactions on image formation and resolution will differ significantly from the effect at higher accelerating voltages. We discuss here sample-beam interactions in single crystals on conducting substrates at low voltages and also present the first results on HRSEM of single crystal morphologies which show some of these effects.


2002 ◽  
Vol 10 (2) ◽  
pp. 22-23 ◽  
Author(s):  
David C Joy ◽  
Dale E Newbury

Low Voltage Scanning Electron Microscopy (LVSEM), defined as operation in the energy range below 5 keV, has become perhaps the most important single operational mode of the SEM. This is because the LVSEM offers advantages in the imaging of surfaces, in the observation of poorly conducting and insulating materials, and for high spatial resolution X-ray microanalysis. These benefits all occur because a reduction in the energy Eo of the incident beam leads to a rapid fall in the range R of the electrons since R ∼k.E01.66. The reduction in the penetration of the beam has important consequences.


Micron ◽  
1996 ◽  
Vol 27 (3-4) ◽  
pp. 247-263 ◽  
Author(s):  
David C. Joy ◽  
Carolyn S. Joy

Sign in / Sign up

Export Citation Format

Share Document