HREM study of tetragonal zirconia in Al2O3/ZrO2 multilayers
The bulk zirconia-alumina system is a model ceramic composite whose fracture toughness is increased via martensitic transformation: i.e. metastable tetragonal zirconia (t-ZrO2) transforms to its stable monoclinic form (m-ZrO2) upon application of stress. To achieve this desirable property it is important to retain a high volume fraction of t-ZrO2 at room temperature. In bulk synthesis this is accomplished by adding dopants, such as yttrium. Recently we have demonstrated that multilayer sputter deposition enables stabilization of tetragonal zirconia without the use of dopants.Amorphous alumina layers were used as termination and restart surfaces for the polycrystalline zirconia layers, as well as an elastic constraint for the t → m transition which involves an anisotropic volume expansion. Double angle X-ray diffraction (XRD) was used to explore the deposition parameters under which t-ZrO2 is retained in the nanolaminate. The zirconia layer thickness was found to be the crucial parameter. The tetragonal phase was detected in all multilayers with ZrO2 layer thickness <20nm.