Overview of the Metrological Scanning Probe Microscopes at PTB

2005 ◽  
Vol 11 (S03) ◽  
pp. 2-5 ◽  
Author(s):  
H. U. Danzebrink ◽  
G. Dai ◽  
F. Pohlenz ◽  
G. Wilkening
Keyword(s):  
Scanning Probe ◽  
Lateral Resolution ◽  
Vertical Resolution ◽  
Contact Mode ◽  
Scanning Procedure ◽  
High Lateral Resolution ◽  
Dimensional Measurements ◽  
Intermittent Contact ◽  
High Vertical Resolution ◽  
Very High

Quantitative dimensional measurements of micro- and nanometre-sized structures are urgently required from science and industry. Due to their very high vertical resolution (down to sub nanometres) and high lateral resolution (<10 nm) scanning probe microscopes (SPMs) are of great interest for such metrological applications. Additionally, SPM methods are able to measure surfaces in a number of modes like contact, intermittent-contact and non-contact mode. The forces between tip and sample are low during the measurement and, even in contact mode, reach only a few nanonewtons. This fact prevents scratching of the measured surface during the SPM scanning procedure even when very sharp tips are used.

Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling

2014 ◽  
Vol 20 (1) ◽  
pp. 90-98 ◽  
Author(s):  
Rolf S. Arvidson ◽  
Cornelius Fischer ◽  
Dale S. Sawyer ◽  
Gavin D. Scott ◽  
Douglas Natelson ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Resolution Enhancement ◽  
Field Of View ◽  
Lateral Resolution ◽  
Large Field ◽  
Vertical Resolution ◽  
Atomic Force ◽  
Scanning Interferometer ◽  
High Vertical Resolution ◽  
Vertical Scanning Interferometry

AbstractWe apply common image enhancement principles and sub-pixel sample positioning to achieve a significant enhancement in the spatial resolution of a vertical scanning interferometer. We illustrate the potential of this new method using a standard atomic force microscope calibration grid and other materials having motifs of known lateral and vertical dimensions. This approach combines the high vertical resolution of vertical scanning interferometry and its native advantages (large field of view, rapid and nondestructive data acquisition) with important increases in lateral resolution. This combination offers the means to address a common challenge in microscopy: the integration of properties and processes that depend on, and vary as a function of observational length.

Evolution of Adsorption Heights in the On-Surface Synthesis and Decoupling of Covalent Organic Networks on Ag(111) by Normal-Incidence X-ray Standing Wave

2021 ◽  
Author(s):  
Lukas Grossmann ◽  
David Andrew Duncan ◽  
Samuel Jarvis ◽  
Robert G Jones ◽  
Soumen De ◽  
...  
Keyword(s):  
Standing Wave ◽  
Structural Characterization ◽  
Scanning Probe Microscopy ◽  
Normal Incidence ◽  
Surface Interactions ◽  
Scanning Probe ◽  
Lateral Resolution ◽  
Molecular Conformations ◽  
X Ray ◽  
High Lateral Resolution

Structural characterization in on-surface synthesis is primarily carried out by Scanning Probe Microscopy (SPM) which provides high lateral resolution. Yet, important fresh perspectives on surface interactions and molecular conformations are...

Intermittent Contact Dynamics of a Micro-Cantilever in High Speed Contact Mode Scanning Probe Microscopy

2015 ◽  
Author(s):  
Somnath Dey ◽  
V. Kartik
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Image Resolution ◽  
Contact Dynamics ◽  
Scanning Probe ◽  
Contact Mode ◽  
Frequency Spectra ◽  
Probe Microscopy ◽  
Intermittent Contact ◽  
Micro Cantilever

The intermittent contact dynamics of a scanning probe microscopy (SPM) micro-cantilever are investigated in the context of high speed imaging in contact mode. At high scan speeds the cantilever can completely detach from the sample surface, and this lowers the achievable image resolution and limits the imaging speed. An analysis is performed, modeling the micro-cantilever as an Euler-Bernoulli beam and approximating the effect of the tip’s contact with the surface by an attached spring with an end mass that is subjected to attractive/repulsive interaction force. At low scan speeds, the cantilever follows the surface profile, while the frequency spectra exhibit a number of side-bands, while at higher speeds, the contact is intermittent. The sensitivity of the cantilever’s deflection varies along the length and hence the image resolution strongly depends on the point selected for optical laser deflection.

High Lateral Resolution Imaging with Sharpened Tip of Multi-Walled Carbon Nanotube Scanning Probe

2004 ◽  
Vol 108 (9) ◽  
pp. 2816-2821 ◽  
Author(s):  
Cattien V. Nguyen ◽  
Chris So ◽  
Ramsey M. Stevens ◽  
You Li ◽  
Lance Delziet ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe ◽  
Lateral Resolution ◽  
Multi Walled Carbon Nanotube ◽  
High Lateral Resolution ◽  
Resolution Imaging

Resolution in the scanning tunneling microscope

1991 ◽  
Vol 49 ◽  
pp. 488-489
Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark
Keyword(s):  
Scanning Tunneling Microscope ◽  
Fundamental Principle ◽  
Atomic Scale ◽  
Lateral Resolution ◽  
Scanning Tunneling ◽  
Electronic Noise ◽  
Vertical Resolution ◽  
Tunneling Microscopy ◽  
Spatial Profile ◽  
Theoretical Analyses

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.

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