Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation Mapping

2015 ◽  
Vol 21 (3) ◽  
pp. 570-581 ◽  
Author(s):  
Dina Goldbaum ◽  
Richard R. Chromik ◽  
Nicolas Brodusch ◽  
Raynald Gauvin

AbstractCold spray is a thermo-mechanical process where the velocity of the sprayed particles affects the deformation, bonding, and mechanical properties of the deposited material, in the form of splats or coatings. At high strain rates, the impact stresses are converted into heat, a phenomenon known as adiabatic shear, which leads to grain re-crystallization. Grain re-crystallization and growth are shown to have a direct impact on the mechanical properties of the cold-sprayed material. The present study ties the microstructural features within the cold-sprayed Ti splats and the substrate to the bonding mechanism and mechanical properties. High-resolution electron channeling contrast imaging, electron backscatter diffraction mapping, and nanoindentation were used to correlate the microstructure to the mechanical properties distribution within the titanium cold-spray splats. The formation of nanograins was observed at the titanium splat/substrate interface and contributed to metallurgical bonding. An increase in grain re-crystallization within the splat and substrate materials was observed with pre-heating of the substrate. In the substrate material, the predominant mechanism of deformation was twinning. A good relationship was found between the hardness and distribution of the twins within the substrate and the size distribution of the re-crystallized grains within the splats.

2012 ◽  
Vol 18 (S2) ◽  
pp. 702-703 ◽  
Author(s):  
J.R. Seal ◽  
T. Bieler ◽  
M. Crimp ◽  
B. Britton ◽  
A. Wilkinson

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


2008 ◽  
Vol 1068 ◽  
Author(s):  
Yoosuf N. Picard ◽  
Christopher Locke ◽  
Christopher L. Frewin ◽  
Rachael L. Myers-Ward ◽  
Joshua D. Caldwell ◽  
...  

ABSTRACTThe electron channeling contrast imaging (ECCI) technique was utilized to investigate atomic step morphologies and dislocation densities in 3C-SiC films grown by chemical vapor deposition (CVD) on Si (001) substrates. ECCI in this study was performed inside a commercial scanning electron microscope using an electron backscatter diffraction (EBSD) system equipped with forescatter diode detectors. This approach allowed simultaneous imaging of atomic steps, verified by atomic force microscopy, and dislocations at the film surface. EBSD analysis verified the orientation and monocrystalline quality of the 3C-SiC films. Dislocation densities in 3C-SiC films were measured locally using ECCI, with qualitative verification by x-ray diffraction. Differences in the dislocation density across a 50 mm diameter 3C-SiC film could be attributed to subtle variations during the carbonization process across the substrate surface.


2014 ◽  
Vol 783-786 ◽  
pp. 750-754
Author(s):  
Iván Gutierrez-Urrutia ◽  
Dierk Raabe

We have investigated the formation of dislocation substructures in high-Mn steels by electron channeling contrast imaging in the SEM. The coupling of electron channeling contrast imaging (ECCI) with electron backscatter diffraction (EBSD) provides an efficient and fast approach to characterize dislocation substructures under controlled diffraction conditions with enhanced contrast. The dislocation substructure of high-Mn steels at intermediate strain levels is characterized by cells and cell blocks with strong crystallographic orientation dependence. We observe a significant effect of strain path on dislocation patterning. Microband formation is enabled under shearing conditions. We explain this effect on terms of Schmid’s law.


2016 ◽  
Vol 22 (5) ◽  
pp. 997-1006 ◽  
Author(s):  
Mahrokh Dorri ◽  
Stéphane Turgeon ◽  
Nicolas Brodusch ◽  
Maxime Cloutier ◽  
Pascale Chevallier ◽  
...  

AbstractCharacterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.


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