Design of the experimental stage for coherent diffraction imaging

2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
Z. D. Pešić ◽  
U. H. Wagner ◽  
C. Rau
Keyword(s):  
Preliminary Design ◽  
X Ray Diffraction ◽  
Contrast Imaging ◽  
Coherent Imaging ◽  
Full Field ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
X Ray Imaging ◽  
Diffraction Imaging ◽  
Experimental Stage

The I13 beamline of Diamond Light Source encompasses two fully independent branches devoted for coherent imaging experiments (coherent X-ray diffraction and ptychography) and X-ray imaging and tomography (full-field microscopy and in-line phase contrast imaging). This contributed paper outlines the main features of the coherence beamline and a preliminary design of the experimental station for coherent X-ray diffraction imaging.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

2014 ◽  
Vol 47 (6) ◽  
pp. 1882-1888 ◽  
Author(s):  
J. Hilhorst ◽  
F. Marschall ◽  
T. N. Tran Thi ◽  
A. Last ◽  
T. U. Schülli
Keyword(s):  
Imaging Techniques ◽  
Light And Electron Microscopy ◽  
Added Value ◽  
Acquisition Time ◽  
Imaging Method ◽  
X Ray Diffraction ◽  
Polymeric Compound ◽  
Full Field ◽  
X Ray ◽  
Diffraction Imaging

Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

scholarly journals Continuous scanning for Bragg coherent X-ray imaging

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Ni Li ◽  
Maxime Dupraz ◽  
Longfei Wu ◽  
Steven J. Leake ◽  
Andrea Resta ◽  
...  
Keyword(s):  
Flow Reactor ◽  
Light Sources ◽  
Pt Nanoparticle ◽  
Strain Fields ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Scan Time ◽  
X Ray Imaging ◽  
Continuous Scanning ◽  
Diffraction Imaging

Abstract We explore the use of continuous scanning during data acquisition for Bragg coherent diffraction imaging, i.e., where the sample is in continuous motion. The fidelity of continuous scanning Bragg coherent diffraction imaging is demonstrated on a single Pt nanoparticle in a flow reactor at $$400\,^\circ \hbox {C}$$ 400 ∘ C in an Ar-based gas flowed at 50 ml/min. We show a reduction of 30% in total scan time compared to conventional step-by-step scanning. The reconstructed Bragg electron density, phase, displacement and strain fields are in excellent agreement with the results obtained from conventional step-by-step scanning. Continuous scanning will allow to minimise sample instability under the beam and will become increasingly important at diffraction-limited storage ring light sources.

Design, development and first experiments on the X-ray imaging beamline at Indus-2 synchrotron source RRCAT, India

2015 ◽  
Vol 22 (6) ◽  
pp. 1531-1539 ◽  
Author(s):  
A. K. Agrawal ◽  
B. Singh ◽  
Y. S. Kashyap ◽  
M. Shukla ◽  
P. S. Sarkar ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Imaging Techniques ◽  
Phase Contrast Imaging ◽  
Design Development ◽  
Contrast Imaging ◽  
Synchrotron Source ◽  
Full Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Micro Tomography

A full-field hard X-ray imaging beamline (BL-4) was designed, developed, installed and commissioned recently at the Indus-2 synchrotron radiation source at RRCAT, Indore, India. The bending-magnet beamline is operated in monochromatic and white beam mode. A variety of imaging techniques are implemented such as high-resolution radiography, propagation- and analyzer-based phase contrast imaging, real-time imaging, absorption and phase contrast tomographyetc. First experiments on propagation-based phase contrast imaging and micro-tomography are reported.

Incorporating particle symmetry into orientation determination in single-particle imaging

2018 ◽  
Vol 74 (5) ◽  
pp. 512-517
Author(s):  
Miklós Tegze ◽  
Gábor Bortel
Keyword(s):  
Three Dimensional ◽  
Symmetric Case ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Particle Imaging ◽  
Single Particle Imaging ◽  
Orientation Determination

In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles as well. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

Investigation of (micro-)meteoritic materials at the new hard X-ray imaging PUMA beamline for heritage sciences

2019 ◽  
Vol 26 (6) ◽  
pp. 2033-2039 ◽  
Author(s):  
Pieter Tack ◽  
Benjamin Bazi ◽  
Bart Vekemans ◽  
Tulin Okbinoglu ◽  
Flore Van Maldeghem ◽  
...  
Keyword(s):  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Contrast Imaging ◽  
X Ray ◽  
High Profile ◽  
Imaging Tool ◽  
X Ray Imaging ◽  
Synchrotron Facility ◽  
Wide Range ◽  
New Instrument

At the French synchrotron facility SOLEIL, a new X-ray imaging facility PUMA (Photons Utilisés pour les Matériaux Anciens) has been made available to scientific communities studying materials from cultural heritage. This new instrument aims to achieve 2D and 3D imaging with microscopic resolution, applying different analytical techniques including X-ray fluorescence spectroscopy (XRF), X-ray absorption spectroscopy (XAS), X-ray diffraction and phase-contrast imaging. In order to discover its capabilities a detailed analytical characterization of this beamline as an analytical and imaging tool is deemed necessary. In this work, (confocal) XRF and XAS analyses are demonstrated using the Seymchan pallasite meteorite and an Antarctic unmelted micrometeorite as case studies. The obtained spatial resolution (2 µm × 3 µm) and sensitivity (detection limits <10 p.p.m. for 1 s acquisition at 18 keV) show that PUMA is a competitive state-of-the-art beamline, providing several high-profile and high-in-demand analytical methods while maintaining applicability towards a wide range of heritage-oriented sciences.

Effect of finite spatial coherence length on small-angle scattering

2015 ◽  
Vol 48 (6) ◽  
pp. 1660-1664 ◽  
Author(s):  
Yuya Shinohara ◽  
Yoshiyuki Amemiya
Keyword(s):  
Small Angle ◽  
Coherence Length ◽  
Spatial Coherence ◽  
Small Angle Scattering ◽  
Forward Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Imaging ◽  
Angle Scattering ◽  
Diffraction Imaging

This study shows that forward scattering at the origin of reciprocal space contributes to the scattering intensity profiles of ultra-small-angle scattering. The forward scattering corresponds to a Fourier transform of the X-ray coherent volume on a sample. This contribution is usually ignored in the study of small-angle scattering, while it is fully considered in the fields of X-ray imaging, such as coherent X-ray diffraction imaging and X-ray ptychography. This effect is explicitly illustrated in the context of small-angle scattering, and the effect of a finite spatial coherence length on small-angle scattering is discussed.

scholarly journals Single-Shot Coherent X-Ray Imaging Instrument at PAL-XFEL

2021 ◽  
Vol 11 (11) ◽  
pp. 5082
Author(s):  
Daeho Sung ◽  
Daewoong Nam ◽  
Myong-jin Kim ◽  
Seonghan Kim ◽  
Kyung Sook Kim ◽  
...  
Keyword(s):  
Correlation Spectroscopy ◽  
Single Shot ◽  
Pump Probe ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
X Ray Imaging ◽  
Scattering Geometry ◽  
Diffraction Imaging ◽  
Imaging Instrument ◽  
Pal Xfel

We developed a single-shot coherent X-ray imaging instrument at the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). This experimental platform was established to conduct a variety of XFEL experiments, including coherent diffraction imaging (CDI), X-ray photon correlation spectroscopy (XPCS), and coherent X-ray scattering (CXS). Based on the forward-scattering geometry, this instrument utilizes a fixed-target method for sample delivery. It is well optimized for single-shot-based experiments in which one expects to observe the ultrafast phenomena of nanoparticles at picosecond temporal and nanometer spatial resolutions. In this paper, we introduce a single-shot coherent X-ray imaging instrument and report pump–probe coherent diffraction imaging (PPCDI) of Ag nanoparticles as an example of its applications.

Recent progress in synchrotron radiation 3D–4D nano-imaging based on X-ray full-field microscopy

Microscopy ◽  
2020 ◽  
Vol 69 (5) ◽  
pp. 259-279
Author(s):  
Akihisa Takeuchi ◽  
Yoshio Suzuki
Keyword(s):  
Synchrotron Radiation ◽  
Fresnel Zone ◽  
Imaging Techniques ◽  
Effective Field ◽  
Current Status ◽  
Full Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Diffraction Imaging ◽  
Nano Imaging

Abstract The advent of high-flux, high-brilliance synchrotron radiation (SR) has prompted the development of high-resolution X-ray imaging techniques such as full-field microscopy, holography, coherent diffraction imaging and ptychography. These techniques have strong potential to establish non-destructive three- and four-dimensional nano-imaging when combined with computed tomography (CT), called nano-tomography (nano-CT). X-ray nano-CTs based on full-field microscopy are now routinely available and widely used. Here we discuss the current status and some applications of nano-CT using a Fresnel zone plate as an objective. Optical properties of full-field microscopy, such as spatial resolution and off-axis aberration, which determine the effective field of view, are also discussed, especially in relation to 3D tomographic imaging.

Quantitative nanotomography of amorphous and polycrystalline samples using coherent X-ray diffraction

2019 ◽  
Vol 52 (3) ◽  
pp. 571-578 ◽  
Author(s):  
Y. Chushkin ◽  
F. Zontone ◽  
O. Cherkas ◽  
A. Gibaud
Keyword(s):  
Mass Density ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Better Than

This article presents a combined approach where quantitative forward-scattering coherent diffraction imaging (CDI) is supported by crystal diffraction using 8.1 keV synchrotron X-ray radiation. The method allows the determination of the morphology, mass density and crystallinity of an isolated microscopic specimen. This approach is tested on three homogeneous samples made of different materials with different degrees of crystallinity. The mass density and morphology are revealed using three-dimensional coherent diffraction imaging with a resolution better than 36 nm. The crystallinity is extracted from the diffraction profiles measured simultaneously with coherent diffraction patterns. The presented approach extends CDI to structural characterization of samples when crystallinity aspects are of interest.

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