scholarly journals Reduction and Increase in Thermal Conductivity of Si Irradiated with Ga+ via Focused Ion Beam

2018 ◽  
Vol 10 (43) ◽  
pp. 37679-37684 ◽  
Author(s):  
S. Alaie ◽  
M. G. Baboly ◽  
Y.-B. Jiang ◽  
S. Rempe ◽  
D. H. Anjum ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Focused Ion Beam ◽  
Ion Beam

Significant thermal conductivity reduction of CVD graphene with relatively low hole densities fabricated by focused ion beam processing

2019 ◽  
Vol 114 (5) ◽  
pp. 051905 ◽  
Author(s):  
Woomin Lee ◽  
Kenneth David Kihm ◽  
Hyun-Taek Lee ◽  
Tielin Li ◽  
Jae Sik Jin ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Cvd Graphene

509 Regulation of thermal conductivity of individual carbon nanotube using focused ion beam

2014 ◽  
Vol 2014.67 (0) ◽  
pp. _509-1_-_509-2_
Author(s):  
Hiroyuki HAYASHI ◽  
Koji TAKAHASHI ◽  
Tatsuya IKUTA ◽  
Takashi NISHIYAMA ◽  
Yasuyuki TAKATA ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Carbon Nanotube ◽  
Focused Ion Beam ◽  
Ion Beam

Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

2015 ◽  
Vol 26 (8) ◽  
pp. 085704 ◽  
Author(s):  
Seyedhamidreza Alaie ◽  
Drew F Goettler ◽  
Ying-Bing Jiang ◽  
Khawar Abbas ◽  
Mohammadhosein Ghasemi Baboly ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Nanocrystalline Structure

A Convenient and Reliable Method of Manufacturing Inclined Bulk Graphite for Measuring Thermal Conductivity With TDTR

2019 ◽  
Author(s):  
Yu Zhao ◽  
Hongyang Yu ◽  
Jingjie Sha ◽  
Yunfei Chen
Keyword(s):  
Thermal Conductivity ◽  
Thermal Transport ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Layered Materials ◽  
Bulk Graphite ◽  
Intrinsic Mechanism ◽  
New Perspective ◽  
The Time Domain

Abstract In this work, in order to study the thermal transport along arbitrary direction in bulk graphite, we develop a simple and convenient method to manufacture inclined bulk graphite applying Focused Ion beam (FIB). Then, we measure the thermal conductivity of inclined bulk graphite with the time-domain thermoreflectance (TDTR) technique and the measured results show that our processing method is reliable. Based on the TDTR measurement of inclined bulk graphite with a tilt angle of 90°, the in-plane thermal conductivity is on the order of 2030 Wm−1 K−1 and the cross-plane thermal conductivity is on the order of 5.5 Wm−1 K−1 at room temperature, which is close to the previously reported results. Our processing and measurement methods provide a new perspective on the study of the intrinsic mechanism of anisotropic thermal transport in anisotropic layered materials.

Measurement of In-Plane Thermal Conductivity Using Suspended SiNx Islands

2012 ◽  
Author(s):  
Seyedhamidreza Alaie ◽  
Drew F. Goettler ◽  
Khawar Abbas ◽  
Ihab El-Kady ◽  
Zayd C. Leseman
Keyword(s):  
Thermal Conductivity ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Temperature Sensors ◽  
Injection System ◽  
Thermo Electric ◽  
Dual Purpose ◽  
Electrical Insulator ◽  
Different Sources ◽  
Separate Measurement

In order to measure in-plane thermal conductivity, electrical resistivity, and Seebeck Coefficient of Phononic Crystals (PnCs) a micro device is designed and fabricated to host different nano-scale samples. The device is comprised of two SiNx suspended membranes with patterned by Pt on top and covered by AlN. The Pt deposited on these two membranes or islands are dual-purpose temperature sensors and heaters. One side of a sample can be attached to each of the two islands. In this way 1-D heat flow can be established in the material to be tested. Covering the islands with AlN enhances the uniformity of temperature on each sensor. Moreover, AlN is an excellent electrical insulator, and it protects the platinum sensors from different sources of doping such as gallium ions used for patterning, depositing, mounting, or demounting different samples on the islands. This ensures the thermo-electric properties of the sensors on the platform do not change after each measurement. Using this design, it is demonstrated that one platform can be used for measurement of a silicon slab and then a separate measurement of a 1-D PnC fabricated from the same sample. The 1-D PnC had a Si-W structure that was fabricated using a Focused Ion Beam (FIB) and a Gas Injection System (GIS) capable of depositing W.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

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