Using a Surface-Sensitive Chemical Probe and a Bulk Structure Technique to Monitor the γ- to θ-Al2O3 Phase Transformation

The Ti-6 wt.% Al-4 wt.% V commercial alloys have exhibited an improved formability at cryogenic temperature when the alloys were heat-treated prior to the tests. The author was interested in further investigating this unusual ductile behavior which may be associated with the strain-induced transformation or twinning of the a phase, enhanced at lower temperatures. The starting materials, supplied by RMI Co., Niles, Ohio were rolled mill products in the form of 40 mil sheets. The microstructure of the as-received materials contained mainly ellipsoidal α grains measuring between 1 and 5μ. The β phase formed an undefined grain boundary around the a grains. The specimens were homogenized at 1050°C for one hour, followed by aging at 500°C for two hours, and then quenched in water to produce the α/β mixed microstructure.

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Microstructural and Microchemical Characterization of Nickel Sulfide Inclusions in Plate Glass

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089123 ◽

1991 ◽

Vol 49 ◽

pp. 962-963

Author(s):

J. Cooper ◽

O. Popoola ◽

W. M. Kriven

Keyword(s):

Thermal Expansion ◽

Phase Transformation ◽

Glass Matrix ◽

Nickel Sulfide ◽

Plate Glass ◽

Thermal Expansion Mismatch ◽

Volume Increase ◽

Β Phase ◽

Microchemical Characterization

Nickel sulfide inclusions have been implicated in the spontaneous fracture of large windows of tempered plate glass. Two alternative explanations for the fracture-initiating behaviour of these inclusions have been proposed: (1) the volume increase which accompanies the α to β phase transformation in stoichiometric NiS, and (2) the thermal expansion mismatch between the nickel sulfide phases and the glass matrix. The microstructure and microchemistry of the small inclusions (80 to 250 μm spheres), needed to determine the cause of fracture, have not been well characterized hitherto. The aim of this communication is to report a detailed TEM and EDS study of the inclusions.

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Decoration technique and surface physics

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010010932x ◽

1978 ◽

Vol 36 (1) ◽

pp. 436-437 ◽

Cited By ~ 1

Author(s):

H. Bethge

Keyword(s):

Diffusion Path ◽

Special Importance ◽

Surface Physics ◽

Step Structure ◽

Initial Stage ◽

Special Cases ◽

Atomic Surface ◽

The Mean ◽

Bulk Structure ◽

Decoration Technique

Besides the atomic surface structure, diverging in special cases with respect to the bulk structure, the real structure of a surface Is determined by the step structure. Using the decoration technique /1/ it is possible to image step structures having step heights down to a single lattice plane distance electron-microscopically. For a number of problems the knowledge of the monatomic step structures is important, because numerous problems of surface physics are directly connected with processes taking place at these steps, e.g. crystal growth or evaporation, sorption and nucleatlon as initial stage of overgrowth of thin films.To demonstrate the decoration technique by means of evaporation of heavy metals Fig. 1 from our former investigations shows the monatomic step structure of an evaporated NaCI crystal. of special Importance Is the detection of the movement of steps during the growth or evaporation of a crystal. From the velocity of a step fundamental quantities for the molecular processes can be determined, e.g. the mean free diffusion path of molecules.

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Profile Imaging of Silicon Surface Reconstructions

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100118229 ◽

1985 ◽

Vol 43 ◽

pp. 262-263

Author(s):

O.L. Krivanek ◽

G.J. Wood

Keyword(s):

Electron Microscopy ◽

Surface Structure ◽

Structure Determination ◽

Silicon Surface ◽

Good Resolution ◽

Surface Reconstructions ◽

Bulk Structure ◽

Point To Point ◽

The Relationship

Electron microscopy at 0.2nm point-to-point resolution, 10-10 torr specimei region vacuum and facilities for in-situ specimen cleaning presents intere; ing possibilities for surface structure determination. Three methods for examining the surfaces are available: reflection (REM), transmission (TEM) and profile imaging. Profile imaging is particularly useful because it giv good resolution perpendicular as well as parallel to the surface, and can therefore be used to determine the relationship between the surface and the bulk structure.

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AEM of reaction-bonded SiC

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100122125 ◽

1992 ◽

Vol 50 (1) ◽

pp. 344-345

Author(s):

K Das Chowdhury ◽

R. W. Carpenter ◽

W. Braue

Keyword(s):

Mechanical Properties ◽

Phase Transformation ◽

High Temperature ◽

Epitaxial Growth ◽

Liquid Silicon ◽

Structural Ceramic ◽

Few Data

Research on reaction-bonded SiC (RBSiC) is aimed at developing a reliable structural ceramic with improved mechanical properties. The starting materials for RBSiC were Si,C and α-SiC powder. The formation of the complex microstructure of RBSiC involves (i) solution of carbon in liquid silicon, (ii) nucleation and epitaxial growth of secondary β-SiC on the original α-SiC grains followed by (iii) β>α-SiC phase transformation of newly formed SiC. Due to their coherent nature, epitaxial SiC/SiC interfaces are considered to be segregation-free and “strong” with respect to their effect on the mechanical properties of RBSiC. But the “weak” Si/SiC interface limits its use in high temperature situations. However, few data exist on the structure and chemistry of these interfaces. Microanalytical results obtained by parallel EELS and HREM imaging are reported here.

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Phase transformation and layer evolution in molybdenum disilicide-silicon carbide nanolayered coatings

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100170426 ◽

1994 ◽

Vol 52 ◽

pp. 538-539

Author(s):

H. Kung ◽

T. R. Jervis ◽

J.-P. Hirvonen ◽

M. Nastasi ◽

T. E. Mitchell ◽

...

Keyword(s):

Phase Transformation ◽

High Temperature ◽

Oxidation Resistance ◽

Elevated Temperatures ◽

Matrix Material ◽

Molybdenum Disilicide ◽

High Temperature Strength ◽

Cross Sectional ◽

Good Oxidation Resistance ◽

Structural Applications

MoSi2 is a potential matrix material for high temperature structural composites due to its high melting temperature and good oxidation resistance at elevated temperatures. The two major drawbacksfor structural applications are inadequate high temperature strength and poor low temperature ductility. The search for appropriate composite additions has been the focus of extensive investigations in recent years. The addition of SiC in a nanolayered configuration was shown to exhibit superior oxidation resistance and significant hardness increase through annealing at 500°C. One potential application of MoSi2- SiC multilayers is for high temperature coatings, where structural stability ofthe layering is of major concern. In this study, we have systematically investigated both the evolution of phases and the stability of layers by varying the heat treating conditions.Alternating layers of MoSi2 and SiC were synthesized by DC-magnetron and rf-diode sputtering respectively. Cross-sectional transmission electron microscopy (XTEM) was used to examine three distinct reactions in the specimens when exposed to different annealing conditions: crystallization and phase transformation of MoSi2, crystallization of SiC, and spheroidization of the layer structures.

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Ferroelectric Domain Structure of Pb(Zr.52Ti.48)03

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000933 ◽

1980 ◽

Vol 38 ◽

pp. 214-215

Author(s):

E.K. Goo ◽

R.K. Mishra

Keyword(s):

Phase Transformation ◽

Domain Structure ◽

Tetragonal Phase ◽

Ferroelectric Domain ◽

Cubic Phase ◽

Ion Milling ◽

Thin Foils ◽

Ferroelectric Domain Structure ◽

Ferroelectric Domains

Ferroelectric domains are twins that are formed when PZT undergoes a phase transformation from a non-ferroelectric cubic phase to a ferroelectric tetragonal phase upon cooling below ∼375°C.,1 The tetragonal phase is spontaneously polarized in the direction of c-axis, making each twin a ferroelectric domain. Thin foils of polycrystalline Pb (Zr.52Ti.48)03 were made by ion milling and observed in the Philips EM301 with a double tilt stage.

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