Strain Mapping in a Graphene Monolayer Nanocomposite

ACS Nano ◽  
2011 ◽  
Vol 5 (4) ◽  
pp. 3079-3084 ◽  
Author(s):  
Robert J. Young ◽  
Lei Gong ◽  
Ian A. Kinloch ◽  
Ibtsam Riaz ◽  
Rashed Jalil ◽  
...  
Keyword(s):  
Graphene Monolayer ◽  
Strain Mapping

scholarly journals Response of free-standing graphene monolayer exposed to ultrashort intense XUV pulse from free-electron laser

2021 ◽  
Vol 154 (20) ◽  
pp. 204706
Author(s):  
N. Medvedev ◽  
H. Noei ◽  
S. Toleikis ◽  
B. Ziaja
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Graphene Monolayer ◽  
Free Standing

scholarly journals Strain Mapping Using EBSD Cross Correlation and Raman Methods

2018 ◽  
Vol 24 (S1) ◽  
pp. 960-961
Author(s):  
M.D. Vaudin ◽  
AJ Gayle ◽  
L.H. Friedman ◽  
R.F. Cook
Keyword(s):  
Cross Correlation ◽  
Strain Mapping

3-D High-Density Strain Mapping Procedure Based on High-Resolution CT

2007 ◽  
Vol 539-543 ◽  
pp. 2377-2382 ◽  
Author(s):  
Masakazu Kobayashi ◽  
Hiroyuki Toda ◽  
Tomomi Ohgaki ◽  
Kentaro Uesugi ◽  
David S. Wilkinson ◽  
...  
Keyword(s):  
High Resolution ◽  
Local Strain ◽  
High Ratio ◽  
High Density ◽  
Strain Mapping ◽  
Mapping Procedure ◽  
Model Method ◽  
Model Sample ◽  
Alumina Particles ◽  
X Ray Computed

A tracking procedure for the high-resolution X-ray computed tomography (CT) has been developed in order to measure 3-D local strain within a deforming material in high-density. A dispersion-strengthened copper alloy model sample with alumina particles, which contains micropores, was visualized by the synchrotron radiation CT. The pores observed in reconstructed CT volumes were used as tracking markers. The developed tracking method using a set of matching parameters, which classifies matched, pended and rejected markers, exhibited high ratio of success tracking. Furthermore, the ratio was improved by applying the spring model method, which is one of the particle image velocity (PIV) methods utilized in the field of the fluid mechanics, to the pended markers. The method based on the image analysis of CT imaging volumes provides us 3-D high-density strain mapping.

Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si

2015 ◽  
Vol 148 ◽  
pp. 94-104 ◽  
Author(s):  
M.D. Vaudin ◽  
W.A. Osborn ◽  
L.H. Friedman ◽  
J.M. Gorham ◽  
V. Vartanian ◽  
...  
Keyword(s):  
Thin Film ◽  
Ebsd Analysis ◽  
Strain Mapping

Error Quantification in Strain Mapping Methods

2007 ◽  
Vol 13 (5) ◽  
pp. 320-328 ◽  
Author(s):  
Elisa Guerrero ◽  
Pedro Galindo ◽  
Andrés Yáñez ◽  
Teresa Ben ◽  
Sergio I. Molina
Keyword(s):  
Electron Microscopy ◽  
Geometric Phase ◽  
Step Response ◽  
Strain Mapping ◽  
Error Quantification ◽  
Transmission Electron ◽  
Mapping Techniques ◽  
Microscopy Images ◽  
Real State

In this article a method for determining errors of the strain values when applying strain mapping techniques has been devised. This methodology starts with the generation of a thickness/defocus series of simulated high-resolution transmission electron microscopy images of InAsxP1−x/InP heterostructures and the application of geometric phase. To obtain optimal defocusing conditions, a comparison of different defocus values is carried out by the calculation of the strain profile standard deviations among different specimen thicknesses. Finally, based on the analogy of real state strain to a step response, a characterization of strain mapping error near an interface is proposed.

scholarly journals Self-Assembly of Hydrofluorinated Janus Graphene Monolayer: A Versatile Route for Designing Novel Janus Nanoscrolls

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Yakang Jin ◽  
Qingzhong Xue ◽  
Lei Zhu ◽  
Xiaofang Li ◽  
Xinglong Pan ◽  
...  
Keyword(s):  
Self Assembly ◽  
Graphene Monolayer
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