scholarly journals A cryo-TSEM with temperature cycling capability allows deep sublimation of ice to uncover fine structures in thick cells

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jiro Usukura ◽  
Akihiro Narita ◽  
Tomoharu Matsumoto ◽  
Eiji Usukura ◽  
Takeshi Sunaoshi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Cell Membrane ◽  
Frozen Section ◽  
Temperature Cycling ◽  
Sem Images ◽  
Simultaneous Acquisition ◽  
Transmission Electron ◽  
New Type ◽  
Fine Structures ◽  
Conventional Transmission Electron Microscope

AbstractThe scanning electron microscope (SEM) has been reassembled into a new type of cryo-electron microscope (cryo-TSEM) by installing a new cryo-transfer holder and anti-contamination trap, which allowed simultaneous acquisition of both transmission images (STEM images) and surface images (SEM images) in the frozen state. The ultimate temperatures of the holder and the trap reached − 190 °C and − 210 °C, respectively, by applying a liquid nitrogen slush. The STEM images at 30 kV were comparable to, or superior to, the images acquired with conventional transmission electron microscope (100 kV TEM) in contrast and sharpness. The unroofing method was used to observe membrane cytoskeletons instead of the frozen section and the FIB methods. Deep sublimation of ice surrounding unroofed cells by regulating temperature enabled to emerge intracellular fine structures in thick frozen cells. Hence, fine structures in the vicinity of the cell membrane such as the cytoskeleton, polyribosome chains and endoplasmic reticulum (ER) became visible. The ER was distributed as a wide, flat structure beneath the cell membrane, forming a large spatial network with tubular ER.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

Observations of thick and thin sections in a field-emission SEM

1994 ◽  
Vol 52 ◽  
pp. 1018-1019
Author(s):  
W. P. Wergin ◽  
S. Roy ◽  
E. F. Erbe ◽  
C. A. Murphy ◽  
C. D. Pooley
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Room Temperature ◽  
Osmium Tetroxide ◽  
Uranyl Acetate ◽  
Chemical Fixation ◽  
Thin Sections ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

Larvae of the nematode, Steinernema carpocapsae Weiser strain All, were cryofixed and freezesubstituted for 3 days in acetone containing 2% osmium tetroxide according to established procedures. Following chemical fixation, the nematodes were brought to room temperature, embedded in Spurr's medium and sectioned for observation with a Hitachi S-4100 field emission scanning electron microscope that was equipped with an Oxford CT 1500 Cryotrans System. Thin sections, about 80 nm thick, similar to those generally used in conventional transmission electron microscope (TEM) studies were mounted on copper grids and stained with uranyl acetate for 30 min and lead citrate for 5 min. Sections about 2 μm thick were also mounted and stained in a similar fashion. The grids were mounted on an Oxford grid holder, inserted into the microscope and onto a cryostage that was operated at ambient temperature. Thick and thin sections of the larvae were evaluated and photographed in the SEM at different accelerating voltages. Figs. 4 and 5 have undergone contrast conversion so that the images would resemble transmitted electron micrographs obtained with a TEM.

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

A High Resolution Study of Alumina Supported Iridium Catalysts

1980 ◽  
Vol 38 ◽  
pp. 202-203
Author(s):  
C. Stoeckert ◽  
B. Etherton ◽  
M. Beer ◽  
J. Gryder
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Metal Particles ◽  
Optical Transfer Function ◽  
Particle Sizes ◽  
Iridium Catalysts ◽  
Transmission Electron ◽  
Optical Transfer ◽  
Conventional Transmission Electron Microscope ◽  
Resolution Study

The interpretation of the activity of catalysts requires information about the sizes of the metal particles, since this has implications for the number of surface atoms available for reaction. To determine the particle dimensions we used a high resolution STEM1. Such an instrument with its simple optical transfer function is far more suitable than a conventional transmission electron microscope for the establishment of particle sizes. We report here our study on the size and number distribution of Ir particles supported on Al2O3 and also examine simple geometric models for the shape of Ir particles.

scholarly journals Fabrication of Mesostructured Silica and Titania Rods on Substrates by Using Polycarbonate Membranes

2010 ◽  
Vol 2010 ◽  
pp. 1-4 ◽  
Author(s):  
Norihiro Suzuki ◽  
Yusuke Yamauchi
Keyword(s):  
Electron Microscope ◽  
Longitudinal Axis ◽  
Sem Images ◽  
One Pot ◽  
Polycarbonate Membrane ◽  
Entire Area ◽  
Transmission Electron ◽  
Polycarbonate Membranes ◽  
Fibrous Morphology ◽  
Oriented Parallel

By using the polycarbonate membrane a template, mesoporous silica rods are fabricated on a silicon substrate in one pot. From scanning electron microscope (SEM) images, the creation of fibrous morphology is confirmed over the entire area. The diameter of the obtained rods is consistent with that of the template. Transmission electron microscope (TEM) images revealed that the tubular mesochannels are uniaxially oriented parallel to the longitudinal axis of the silica rods. The mesoporous titania rods with anatase crystalline frameworks are also fabricated.

A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope

2005 ◽  
Vol 475-479 ◽  
pp. 4029-4034 ◽  
Author(s):  
Katsuhiro Sasaki ◽  
Hiroyasu Saka
Keyword(s):  
Magnetic Field ◽  
Electron Microscope ◽  
Field Distribution ◽  
Transmission Electron Microscope ◽  
Electrostatic Field ◽  
Field Observation ◽  
Simple Method ◽  
Transmission Electron ◽  
Novel Method ◽  
Conventional Transmission Electron Microscope

A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.

Application of the Short Focal Length Objective to Biological Substances

1967 ◽  
Vol 25 ◽  
pp. 224-225
Author(s):  
W. W Harri
Keyword(s):  
Molecular Structure ◽  
Electron Microscope ◽  
Serum Albumin ◽  
Plasma Protein ◽  
Transmission Electron Microscope ◽  
Focal Length ◽  
Resolving Power ◽  
Transmission Electron ◽  
Short Focal Length ◽  
Conventional Transmission Electron Microscope

Possible improvement in resolving power by use of objective focal lengths of 2 mm in the conventional transmission electron microscope has been described by Heidenreich and Armbruster and by H. Fernandez-Moran. A modified Siemens Elmiskop IA has been used to examine a plasma protein, some polyamino acids, sRNA, 50s ribosome preparations, serum albumin, and myoglobin in unsupported specimens.Characteristics of the images obtained in defocussed images will be discussed in relation to the molecular structure of these compounds.

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