scholarly journals Spatially controlled epitaxial growth of 2D heterostructures via defect engineering using a focused He ion beam

2021 ◽  
Vol 5 (1) ◽  
Author(s):  
Martin Heilmann ◽  
Victor Deinhart ◽  
Abbes Tahraoui ◽  
Katja Höflich ◽  
J. Marcelo J. Lopes

AbstractThe combination of two-dimensional (2D) materials into heterostructures enables the formation of atomically thin devices with designed properties. To achieve a high-density, bottom-up integration, the growth of these 2D heterostructures via van der Waals epitaxy (vdWE) is an attractive alternative to the currently mostly employed mechanical transfer, which is problematic in terms of scaling and reproducibility. Controlling the location of the nuclei formation remains a key challenge in vdWE. Here, a focused He ion beam is used to deterministically place defects in graphene substrates, which serve as preferential nucleation sites for the growth of insulating, 2D hexagonal boron nitride (h-BN). Therewith a mask-free, selective-area vdWE (SAvdWE) is demonstrated, in which nucleation yield and crystal quality of h-BN are controlled by the ion beam parameters used for defect formation. Moreover, h-BN grown via SAvdWE is shown to exhibit electron tunneling characteristics comparable to those of mechanically transferred layers, thereby lying the foundation for a reliable, high-density array fabrication of 2D heterostructures for device integration via defect engineering in 2D substrates.

2019 ◽  
Author(s):  
Matěj Velický ◽  
Sheng Hu ◽  
Colin R. Woods ◽  
Peter S. Toth ◽  
Viktor Zólyomi ◽  
...  

Marcus-Hush theory of electron transfer is one of the pillars of modern electrochemistry with a large body of supporting experimental evidence presented to date. However, some predictions, such as the electrochemical behavior at microdisk electrodes, remain unverified. Herein, we present a study of electron tunneling across a hexagonal boron nitride barrier between a graphite electrode and redox levels in a liquid solution. This was achieved by the fabrication of microdisk electrodes with a typical diameter of 5 µm. Analysis of voltammetric measurements, using two common redox mediators, yielded several electrochemical parameters, including the electron transfer rate constant, limiting current, and transfer coefficient. They show a significant departure from the Butler-Volmer behavior in a clear manifestation of the Marcus-Hush theory of electron transfer. In addition, our system provides a novel experimental platform, which could be applied to address a number of scientific problems such as identification of reaction mechanisms, surface modification, or long-range electron transfer.


Author(s):  
Daniel Cavasin ◽  
Abdullah Yassine

Abstract Bond pad metal corrosion was observed during assembly process characterization of a 0.13um Cu microprocessor device. The bond pad consisted of 12kÅ of Al-0.5%Cu atop 9kÅ of Cu, separated by a thin Ta diffusion barrier. The corrosion was first noted after the wafer dicing process. Analysis of the pad surface revealed pitting-type corrosion, consistent with published reports of classic galvanic cell reactions between Al2Cu (theta phase) particles and the surrounding Al pad metal. Analysis of the bond pads on samelot wafers which had not been diced showed higher-thanexpected incidence of hillock and pit hole defects on the Al surface. Statistically designed experiments were formulated to investigate the possibility that the observed pre-saw pad metal defects act as nucleation sites for galvanic corrosion during the sawing process. Analyses of the experimental samples were conducted using optical and scanning electron microscopy, along with focused ion beam deprocessing and energy dispersive X-ray. This paper explores the relationship between the presence of these pre-existing defects and the propensity for the bond pads to corrode during the dicing process, and reviews the conditions under which pit hole defects are formed during the final stages of the Cu-metallized wafer fabrication process. Indications are that strict control of wafer fab backend processes can reduce or eliminate the incidence of such defects, resulting in elimination of bond pad corrosion in the wafer dicing process.


2019 ◽  
Vol 682 ◽  
pp. 109-120 ◽  
Author(s):  
Wjatscheslaw Sakiew ◽  
Stefan Schrameyer ◽  
Marco Jupé ◽  
Philippe Schwerdtner ◽  
Nick Erhart ◽  
...  

2021 ◽  
Vol 13 (39) ◽  
pp. 47283-47292
Author(s):  
Yongliang Chen ◽  
Chi Li ◽  
Simon White ◽  
Milad Nonahal ◽  
Zai-Quan Xu ◽  
...  

2000 ◽  
Vol 18 (4) ◽  
pp. 573-581 ◽  
Author(s):  
S. STÖWE ◽  
U. NEUNER ◽  
R. BOCK ◽  
M. DORNIK ◽  
V.E. FORTOV ◽  
...  

The hydrodynamic response of metal targets to volume heating by energy deposition of intense heavy-ion beams was investigated experimentally. Recent improvements in beam parameters led to a marked increase in specific deposition power: 2·101040Ar18+ ions of 300 MeV/u focused to a spot size of 300 μm (σ) × 540 μm (σ) yield a specific deposition energy in solid lead of approximately 1 kJ/g in the Bragg peak, delivered within 250 ns [full width at half maximum (FWHM)]. This value allowed us for the first time to observe heavy-ion-beam-induced hydrodynamic expansion of metal volume targets. Measurements comprise expansion velocities of free surfaces of up to 290 ± 20 m/s, surface temperatures of ejected target matter of 1600–1750 K, and pressure waves in solid metal bulk targets of 0.16 GPa maximum absolute value and 0.8 μs FWHM. The experimental results agree well with the results of a 2D hydrodynamic code. Inside the interaction zone, which can only be accessed by simulation, maximum temperatures are 2800 K and maximum pressures are 3.8 GPa.


2006 ◽  
Vol 24 (4) ◽  
pp. 541-551 ◽  
Author(s):  
F. BECKER ◽  
A. HUG ◽  
P. FORCK ◽  
M. KULISH ◽  
P. NI ◽  
...  

An intense and focused heavy ion beam is a suitable tool to generate high energy density in matter. To compare results with simulations it is essential to know beam parameters as intensity, longitudinal, and transversal profile at the focal plane. Since the beam's energy deposition will melt and evaporate even tungsten, non-intercepting diagnostics are required. Therefore a capacitive pickup with high resolution in both time and space was designed, built and tested at the high temperature experimental area at GSI. Additionally a beam induced fluorescence monitor was investigated for the synchrotron's (SIS-18) energy-regime (60–750 AMeV) and successfully tested in a beam-transfer-line.


1987 ◽  
Vol 59 (15) ◽  
pp. 1930-1937 ◽  
Author(s):  
Richard B. Cole ◽  
Christian. Guenat ◽  
J. Ronald. Hass ◽  
Richard W. Linton

2021 ◽  
Author(s):  
Chenghao Wan ◽  
Jura Rensberg ◽  
Zhen Zhang ◽  
Martin Hafermann ◽  
Hongyan Mei ◽  
...  

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