Derivation of the surface free energy of ZnO and GaN using in situ electron beam hole drilling

Nanoscale ◽  
2016 ◽  
Vol 8 (1) ◽  
pp. 634-640 ◽  
Author(s):  
Jay Ghatak ◽  
Jun-Han Huang ◽  
Chuan-Pu Liu
2007 ◽  
Vol 7 (12) ◽  
pp. 4642-4648 ◽  
Author(s):  
M. Hannig ◽  
L. Kriener ◽  
W. Hoth-Hannig ◽  
C. Becker-Willinger ◽  
H. Schmidt

Caries and periodontitis, the most wide-spread oral diseases around the world, are caused by bacterial adherence and biofilm formation onto the natural as well as restored tooth surface. One possible way to prevent the pathogenic consequences of intraoral biofilm formation might be the modification of the tooth surface by application of an anti-adhesive coating that interferes with the bacterial attachment and subsequent bacterial accumulation. The objective of this study was to investigate the effect of an experimental, low surface free energy nano-composite coating material on biofilm formation in situ. For this purpose, an organic/inorganic nano-composite coating (NANOMER®, INM, Saarbrücken, Germany) with a surface free energy of 18–20 mJ/m2 was applied to enamel as well as titanium specimens. The nano-composite coated specimens and un-coated controls were attached to removable intraoral splints and carried by volunteers over 24 h in the oral cavity. After intraoral exposure, specimens were processed for transmission electron microscopic analysis. On non-coated enamel and titanium control samples a multi-layer of adherent bacteria was found. In contrast, on nano-composite coated specimens strongly reduced biofilm formation was observed. In most areas of the surface-coated specimens only a 10–20 nm thick electron dense layer of adsorbed salivary proteins with adherent protein agglomerates of 20–80 nm diameter could be detected. In addition, detachment of the adsorbed biofilm from the nano-composite coated surfaces was evident in electron microscopic micrographs. The present investigation provides ultrastructural evidence that it is possible to cover enamel as well as titanium with a nano-composite coating revealing easy-to-clean surface properties that cause reduced biofilm formation and accelerated removal of adherent biofilms under oral conditions.


1988 ◽  
Vol 116 ◽  
Author(s):  
S. Blunier ◽  
H. Zogg ◽  
H. Weibel

AbstractStacks of non lattice matched epitaxial CaF2, SrF2 and BaF2 layers have been grown by MBE onto Si(lll), and, for the first time, onto Si(l00). On CaF2 covered Si(lll) surfaces, BaF2 grows in a 2—d way after formation of the first monolayers despite a lattice mismatch of 14%. On Si(l00), BaF2 grows with the same (100)—lattice orientation as the underlying substrateif at least a thin (=100 Å) intermediate CaF2 layer is deposited first. Growth is 3—d on (100)—surfaces because of the large (100)—surface free energy of the group IIa—fluorides. By applying in situ short anneal cyclesat the first stages of growth, the crystallographic quality increases for (111)— as well as for (100)—orientation.


Polimery ◽  
2008 ◽  
Vol 53 (06) ◽  
pp. 446-451 ◽  
Author(s):  
MARIAN ZENKIEWICZ ◽  
PIOTR RYTLEWSKI ◽  
JOANNA CZUPRYNSKA ◽  
JULIAN POLANSKI ◽  
TOMASZ KARASIEWICZ ◽  
...  

2009 ◽  
Vol 15 (3) ◽  
pp. 204-212 ◽  
Author(s):  
Shiahn J. Chen ◽  
David G. Howitt ◽  
Brian C. Gierhart ◽  
Rosemary L. Smith ◽  
Scott D. Collins

AbstractAnin situelectron energy loss spectroscopy (EELS) technique has been developed to investigate the dynamic processes associated with electron-beam nanofabrication on thin membranes. In this article, practical applications germane to e-beam nanofabrication are illustrated with a case study of the drilling of nanometer-sized pores in silicon nitride membranes. This technique involves successive acquisitions of the plasmon-loss and the core-level ionization-loss spectra in real time, both of which provide the information regarding the hole-drilling kinetics, including two respective rates for total mass loss, individual nitrogen and silicon element depletion, and the change of the atomic bonding environment. In addition, thein situEELS also provides an alternative method for endpoint detection with a potentially higher time resolution than by imaging. On the basis of the time evolution ofin situEELS spectra, a qualitative working model combining knock-on sputtering, irradiation-induced mass transport, and phase separation can be proposed.


RSC Advances ◽  
2014 ◽  
Vol 4 (17) ◽  
pp. 8446 ◽  
Author(s):  
M. Selvi ◽  
M. R. Vengatesan ◽  
S. Devaraju ◽  
Manmohan Kumar ◽  
M. Alagar

Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.


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