scholarly journals Large Dimension and Low-Cost Fe-SMA Rods

2019 ◽  
Vol 271 ◽  
pp. 01005
Author(s):  
Hande Ozcan ◽  
Ji Ma ◽  
Jeremy E. Schaffer ◽  
Ibrahim Karaman
Keyword(s):  
Grain Growth ◽  
Single Phase ◽  
Electron Backscatter Diffraction ◽  
Low Cost ◽  
Large Diameter ◽  
Heat Treatments ◽  
Two Phase ◽  
Electron Backscatter ◽  
Bamboo Structure ◽  
Backscatter Diffraction

The effects on sample size on abnormal grain growth in inexpensive FeMnAlNi shape memory alloy (SMAs) wires and rod were investigated. It was shown that repeated heat treatments between single phase (bcc) and two phase (bcc + fcc) region resulted in abnormal grains with bamboo structure both in small sized wires and large diameter rods. Microstructural features were investigated using electron backscatter diffraction (EBSD) and it was found that 0.5 mm wires possess strong [011] texture whereas, large diameter rods have random texture after grain growth heat treatments.

Heteroepitaxy of Ge on Cube-Textured Ni(001) Foils Through CaF2 Buffer Layer

MRS Advances ◽  
2016 ◽  
Vol 1 (43) ◽  
pp. 2947-2952
Author(s):  
L. Chen ◽  
Z.-H. Lu ◽  
T.-M. Lu ◽  
I. Bhat ◽  
S.B. Zhang ◽  
...  
Keyword(s):  
Buffer Layer ◽  
High Efficiency ◽  
Electron Backscatter Diffraction ◽  
Low Cost ◽  
High Quality ◽  
Tem Analysis ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Image Position ◽  
Backscatter Diffraction

ABSTRACTEpitaxial Ge films are useful as a substrate for high-efficiency solar cell applications. It is possible to grow epitaxial Ge films on low cost, cube textured Ni(001) sheets using CaF2(001) as a buffer layer. Transmission electron microscopy (TEM) analysis indicates that the CaF2(001) lattice has a 45o in-plane rotation relative to the Ni(001) lattice. The in-plane epitaxy relationships are CaF2[110]//Ni[100] and CaF2[$\bar 1$10]//Ni[010]. Energy dispersive spectroscopy (EDS) shows a sharp interface between Ge/CaF2 as well as between CaF2/Ni. Electron backscatter diffraction (EBSD) shows that the Ge(001) film has a large grain size (∼50 μm) with small angle grain boundaries (< 8o). The epitaxial Ge thin film has the potential to be used as a substrate to grow high quality III-V and II-VI semiconductors for optoelectronic applications.

Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)

2017 ◽  
Vol 23 (3) ◽  
pp. 460-471 ◽  
Author(s):  
Landon T. Hansen ◽  
Brian E. Jackson ◽  
David T. Fullwood ◽  
Stuart I. Wright ◽  
Marc De Graef ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Electron Backscatter Diffraction ◽  
Low Cost ◽  
Electron Backscatter ◽  
Deformation Mechanics ◽  
Ebsd Technique ◽  
Backscatter Diffraction ◽  
The Impact ◽  
Influence Of Noise ◽  
Shed Light

AbstractStudies of dislocation density evolution are fundamental to improved understanding in various areas of deformation mechanics. Recent advances in cross-correlation techniques, applied to electron backscatter diffraction (EBSD) data have particularly shed light on geometrically necessary dislocation (GND) behavior. However, the framework is relatively computationally expensive—patterns are typically saved from the EBSD scan and analyzed offline. A better understanding of the impact of EBSD pattern degradation, such as binning, compression, and various forms of noise, is vital to enable optimization of rapid and low-cost GND analysis. This paper tackles the problem by setting up a set of simulated patterns that mimic real patterns corresponding to a known GND field. The patterns are subsequently degraded in terms of resolution and noise, and the GND densities calculated from the degraded patterns using cross-correlation ESBD are compared with the known values. Some confirmation of validity of the computational degradation of patterns by considering real pattern degradation is also undertaken. The results demonstrate that the EBSD technique is not particularly sensitive to lower levels of binning and image compression, but the precision is sensitive to Poisson-type noise. Some insight is also gained concerning effects of mixed patterns at a grain boundary on measured GND content.

scholarly journals Twinning in SnO2-based ceramics doped with CoO and Nb2O5: morphology of multiple twins revealed by electron backscatter diffraction

2020 ◽  
Vol 76 (5) ◽  
pp. 875-883
Author(s):  
José Alberto Padrón-Navarta ◽  
Fabrice Barou ◽  
Nina Daneu
Keyword(s):  
Solid State ◽  
Grain Growth ◽  
Electron Backscatter Diffraction ◽  
Automated Identification ◽  
Twin Domain ◽  
Electron Backscatter ◽  
Different Types ◽  
Average Size ◽  
Grain Misorientation ◽  
Backscatter Diffraction

Electron backscatter diffraction (EBSD) was used for the analysis of multiple cyclic twins in cassiterite (SnO2), which form during sintering of SnO2 with small additions of CoO and Nb2O5. Grain misorientation analysis has shown that about one third of all grains contain {101} twin boundaries (TBs). The majority of these grains are contact twins, whereas a small fraction of grains are multiple, mainly cyclic twins. A procedure was developed in MTEX [Bachmann, Hielscher & Schaeben (2010). Solid State Phenom. 160, 63–88] for automated identification of crystallographically different types of cyclic twins and found two main types: coplanar twins composed of three or four domains with a common [010] axis and alternating twins composed of three to seven domains oriented along the [111] axis. Both types of cyclic twins have a characteristic common origin (nucleus) of all TBs, which is positioned eccentric relative to the grain section and the cycle is closed with a shorter non-crystallographic contact between the first and the last twin domain. The morphology of cyclic twins suggests that they form by nucleation in the initial stages of grain growth. The average size of twinned grains increases with the number of twin domains indicating the influence of TBs formation on the growth of composite grains.

Effect of Heat Treatment on the Ductility of Ni(γ)/Ni3Al(γ') Two-phase Alloy Foils

2006 ◽  
Vol 980 ◽  
Author(s):  
Motonori Nakamura ◽  
Masahiko Demura ◽  
Ya Xu ◽  
Toshiyuki Hirano
Keyword(s):  
Heat Treatment ◽  
Single Phase ◽  
Electron Backscatter Diffraction ◽  
Tensile Elongation ◽  
Treatment Temperature ◽  
Two Phase ◽  
Heat Treated ◽  
High Fraction ◽  
Cold Rolled ◽  
Backscatter Diffraction

AbstractThe microstructures and room-temperature tensile properties were examined in the 95% cold-rolled and subsequently heat-treated foils of the boron-free Ni(γ)/Ni3Al(γ') two-phase (Ni-18at.%Al) alloys. The electron backscatter diffraction measurements revealed that the recrystallization started at 873 K/0.5 h and that it completed at 1273 K/0.5 h. While the foils showed no tensile elongation in the cold-rolled state, they became ductile after the heat-treatments at 873 K and above. The tensile elongation increased with the increasing heat-treatment temperature: it reached to 14% at 1273 K/0.5 h. The tensile elongation and the fracture strength were high, compared to those in the γ' single-phase foils. The fracture mode was intergranular, and it changed to a mix of intergranular and transgranular in the foils heat-treated at 1273 K/0.5 h, where the area fraction of crack resistant boundaries such as °1, °3 and °9 was high, 0.63. The high ductility was ascribed to the existence of the ductile γ matrix and to the high fraction of crack-resistant boundaries.

In situObservation of Grain Growth on Electroplated Cu Film by Electron Backscatter Diffraction

2009 ◽  
Vol 48 (6) ◽  
pp. 066507 ◽  
Author(s):  
Takenao Nemoto ◽  
Tatsuya Fukino ◽  
Sadahiro Tsurekawa ◽  
Xun Gu ◽  
Akinobu Teramoto ◽  
...  
Keyword(s):  
Grain Growth ◽  
Electron Backscatter Diffraction ◽  
Cu Film ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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